Thermal and electrical effects caused by outdoor hot-spot testing in associations of photovoltaic cells

Progress in Photovoltaics: Research and Applications

Volumn 11, Issue 5, 2003, Pages 293-307

  Alonso Garcia M C ^a   Herrmann, W ^b   Bohmer W ^c   Proisy, B ^d  

^a CIEMAT   (Spain)

^b Institute for Software Electronics Railroad Technology (ISEB)   (Germany)

^c Flabeg Solar International GmbH   (Germany)

^d ZI Champfleuri   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRIC CURRENTS; ENCAPSULATION; LEAKAGE CURRENTS; SILICON; THERMAL EFFECTS;

CRYSTALLINE SILICON MODULES; CURRENT FLOWS; ELECTRICAL EFFECTS; OUTDOOR HOT SPOT TESTING;

PHOTOVOLTAIC CELLS;

PHOTOVOLTAIC SYSTEM;

EID: 3142719028     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.490     Document Type: Article

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