Structural change of oxide-ion-conducting lanthanum silicate on heating from 295 to 1073 K

Solid State Ionics

Volumn 178, Issue 27-28, 2007, Pages 1523-1529

  Iwata, Tomoyuki ^a   Fukuda, Koichiro ^a   Béchade, Emilie ^b   Masson, Olivier ^b   Julien, Isabelle ^b   Champion, Eric ^b   Thomas, Philippe ^b  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF LIMOGES   (France)

Author keywords

Apatite type structure; High temperature X ray powder diffraction; Lanthanum silicate; Maximum entropy method; Oxide ion conductor; Rietveld method

Indexed keywords

CARRIER CONCENTRATION; ENTROPY; RIETVELD METHOD; THERMAL EXPANSION; X RAY POWDER DIFFRACTION;

APATITE TYPE STRUCTURES; LANTHANUM SILICATES; MAXIMUM ENTROPY METHOD; OXIDE ION CONDUCTORS; PATTERN FITTING METHOD;

LANTHANUM COMPOUNDS;

EID: 36048984014     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2007.09.006     Document Type: Article

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