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Volumn 2, Issue , 2005, Pages 493-502

(Invited) precise structural analysis through high-temperature neutron and synchrotron powder diffractometry

Author keywords

Conduction path; Crystal structure; High temperature diffraction; Maximum entropy method; Neutron diffraction; Positional disorder; Rietveld analysis; Synchrotron diffraction

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL STRUCTURE; PEROVSKITE; PHASE TRANSITIONS; SIGNAL TO NOISE RATIO;

EID: 33645285014     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (21)
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  • 17
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  • 19
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.