Development of near-field fluorescence lifetime thermometry

Nanoscale and Microscale Thermophysical Engineering

Volumn 13, Issue 2, 2009, Pages 77-87

  Taguchi, Yoshihiro ^a   Oka, Takumi ^a   Saiki, Toshiharu ^a   Ngasaka, Yuji ^a  

^a KEIO UNIVERSITY   (Japan)

Author keywords

Fluorescence lifetime; Frequency domain lifetime measurement; Near field optics; Optical thermometry

Indexed keywords

DIFFRACTION LIMIT OF LIGHT; EXPERIMENTAL APPARATUS; FLUORESCENCE LIFETIME; FLUORESCENCE LIFETIME MEASUREMENTS; FLUORESCENCE LIFETIMES; FREQUENCY DOMAIN LIFETIME MEASUREMENT; FREQUENCY DOMAINS; MEASUREMENT RESULTS; MICRO WIRE; NANO SCALE; NANOSCALE SPATIAL RESOLUTION; NEAR-FIELD FLUORESCENCE; NEAR-FIELD OPTICS; OPTICAL THERMOMETER; OPTICAL THERMOMETRY; SAMPLE SURFACE; TEMPERATURE DEPENDENCE; TEMPERATURE GRADIENT; TEMPERATURE MAPPING; TEMPERATURE PROBES; THERMAL SYSTEM DESIGN;

FREQUENCY DOMAIN ANALYSIS; LIGHT; NANOSTRUCTURED MATERIALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; TEMPERATURE MEASUREMENT; TEMPERATURE SENSORS; THERMOMETERS;

FLUOROPHORES;

EID: 70349515558     PISSN: 15567265     EISSN: None     Source Type: Journal    
DOI: 10.1080/15567260902820821     Document Type: Article

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