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Volumn 95, Issue 11, 2009, Pages

Toward full carbon interconnects: High conductivity of individual carbon nanotube to carbon nanotube regrowth junctions

(9) Tuukkanen, S a Streiff, S a Chenevier, P a Pinault, M b Jeong, H J c Enouz Vedrenne, S c Cojocaru, C S c Pribat, D c Bourgoin, J P a

a DIF (France)

b CEA SACLAY (France)

c LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; SEMICONDUCTOR JUNCTIONS; YARN;

CARBON NANOTUBE JUNCTIONS; CHEMICAL VAPOR DEPOSITIONS (CVD); ELECTRICAL INTERCONNECTS; ELECTRICAL MEASUREMENT; ELECTRONIC APPLICATION; HIGH CONDUCTIVITY; STATISTICAL DATAS;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 70349509238 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3216839 Document Type: Article

Times cited : (17)

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