![]() |
Volumn 93, Issue 19, 2008, Pages
|
Effect of structural anisotropy on electronic conduction in delafossite tin doped copper indium oxide thin films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ACTIVATION ENERGY;
CIVIL AVIATION;
COPPER;
COPPER COMPOUNDS;
COPPER OXIDES;
HEAT CONDUCTION;
MAGNETRON SPUTTERING;
NANOCRYSTALLINE ALLOYS;
OXIDE FILMS;
THICK FILMS;
THIN FILMS;
TIN;
TITANIUM COMPOUNDS;
ACTIVATED CARRIERS;
CRYSTALLITE ORIENTATIONS;
DELAFOSSITE;
ELECTRONIC CONDUCTIONS;
INDIUM OXIDES;
SN DOPED;
STRUCTURAL ANISOTROPIES;
SUBSTRATE TEMPERATURES;
CRYSTALLITES;
|
EID: 56249105792
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2982915 Document Type: Article |
Times cited : (7)
|
References (17)
|