SEM image analysis for quality control of nanoparticles

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 5702 LNCS, Issue , 2009, Pages 590-597

  Alexander, S K ^a   Azencott, R ^a   Bodmann, B G ^a   Bouamrani, A ^b   Chiappini, C ^b   Ferrari, M ^b   Liu, X ^b   Tasciotti, E ^b  

^a University of Houston   (United States)

^b UNIVERSITY OF TEXAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTING SPEED; CONTROL METHODS; CONTROL REQUIREMENTS; GRAPHIC DISPLAYS; IMAGE ANALYSIS ALGORITHMS; IMAGE ANALYSIS SOFTWARE; MESOPOROUS SILICON; MICRON SCALE; OUTER DIAMETERS; PRECISE POSITION; SCANNING ELECTRONIC MICROSCOPY; SEM; SEM IMAGE ANALYSIS; SHAPE CHARACTERISTICS; SHAPE FEATURES; STANDARD DEVIATION; TEXTURE SEGMENTATION;

COMPUTER SOFTWARE; IMAGE ANALYSIS; NANOPARTICLES; NANOPORES; QUALITY ASSURANCE; QUALITY FUNCTION DEPLOYMENT; TOTAL QUALITY MANAGEMENT;

QUALITY CONTROL;

EID: 70349303616     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-03767-2_72     Document Type: Conference Paper

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