Secure AES engine with a local switched-capacitor current equalizer

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2009, Pages

  Tokunaga, Carlos ^a   Blaauw, David ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70349299097     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2009.4977309     Document Type: Conference Paper

References (11)

1. Advanced Encryption Standard (AES), FIPS 197, National Institute of Standards and Technology, Nov. 2001.
2. J. Daemen, V. Rijmen, The Design of Rijndael (AES - The Advanced Encryption Standard), Springer, 2002.
3. P. Kocher, J. Jaffe, B. Jun, "Differential Power Analysis", Proc. Advances in Cryptology (CRYPTO 1999), pp. 388-397, 1999.
4. T. Messerges, "Using Second-Order Power Analysis to Attack DPA resistant Software", CHES 2000, LNCS 1965, pp 238-251, 2000.
5. R. Bevan, E. Knudsen, "Ways to Enhance Differential Power Analysis", ICISC 2002, LCNS 2587, pp. 327-342, 2003.
6. T. Messerges, E. Dabbish, R. Sloan, "Examining Smart-Card Security under the Threat of Power Analysis Attacks", IEEE Trans. Computers, vol.51, no.5, May 2002.
7. S. Mangard, T. Popp, B. Gammel, "Side-Channel Leakage of Masked CMOS Gates", CT-RSA 2005, LNCS 3376, pp. 351-365, 2005.
8. C. Clavier, J. Coron, N. Daboous, "Differential Power Analysis in the Presence of Hardware Countermeasures", CHES 2000, LNCS 1965, pp. 252-263, 2000. (Pubitemid 33213973)
9. P. Corsonello, S. Perri, M. Margala, "An Integrated Countermeasure against Differential Power Analysis for Secure Smart-Cards", ISCAS, 2006.
10. D. Hwang, K. Tiri, A. Hodjat, B. Lai, S. Yang, P. Schaumont, I. Verbauwhede, "AES-Based Security Coprocessor IC in 0.18μm CMOS with Resistance to Differential Power Analysis Side-Channel Attacks", IEEE J. Solid-State Circuits, vol.41, no.4, 2006.
11. M. Nagata, T. Okumoto, K. Taki, "A Built-in Technique for Probing Power Supply and Ground Noise Distribution within Large-Scale Digital Integrated Circuits", IEEE J. Solid- State Circuits, vol.40, no.4, Apr. 2005