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Volumn 3376, Issue , 2005, Pages 351-365

Side-channel leakage of masked CMOS gates

Author keywords

DPA; Masked Digital Circuits; Masked Logic Gates; Masking; Power Analysis

Indexed keywords

LOGIC GATES; MASKS;

EID: 24144459808     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-30574-3_24     Document Type: Conference Paper
Times cited : (237)

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