Dielectric relaxation and morphologic properties of CaCu3Ti4O12 doped with GeO2

Journal of Non-Crystalline Solids

Volumn 355, Issue 43-44, 2009, Pages 2160-2164

  Amaral, F ^a,b   Costa, L C ^a   Valente, M A ^a   Henry, F ^c  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b Oliveira do Hospital   (Portugal)

^c CNRS   (France)

Author keywords

Dielectric properties; Electric modulus; Relaxation

Indexed keywords

COLE-COLE MODELS; DIELECTRIC CONSTANTS; ELECTRIC MODULUS; ENERGY DISPERSIVE X-RAY SPECTROMETRY; FREQUENCY RANGES; GIANT DIELECTRIC CONSTANTS; GOOD STABILITY; IMPEDANCE SPECTROSCOPY; IMPEDANCE SPECTROSCOPY MEASUREMENTS; PREPARATION METHOD; RELAXATION; SEM;

CALCIUM ALLOYS; CERAMIC CAPACITORS; DIELECTRIC RELAXATION; DIELECTRIC WAVEGUIDES; DIFFRACTION; DOPING (ADDITIVES); GRAIN BOUNDARIES; PERMITTIVITY; POLYMER BLENDS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ELECTRIC PROPERTIES;

EID: 70349156404     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.06.034     Document Type: Article

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