Importance of using complementary process analyzers for the process monitoring, analysis, and understanding of freeze drying

Analytical Chemistry

Volumn 81, Issue 18, 2009, Pages 7639-7649

  De Beer, T R M ^a   Wiggenhorn, M ^b   Veillon, R ^c   Debacq, C ^c   Mayeresse, Y ^c   Moreau, B ^c   Burggraeve, A ^a   Quinten, T ^a   Friess, W ^b   Winter, G ^b   Vervaet, C ^a   Remon, J P ^a   Baeyens, W R G ^a  

^a GHENT UNIVERSITY   (Belgium)

^b UNIVERSITY OF MUNICH   (Germany)

^c GLAXOSMITHKLINE BIOLOGICALS   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ANALYSIS; END POINTS; FREEZE DRYING; FREEZE-DRYING PROCESS; IN-LINE; MODEL SYSTEM; MULTIVARIATE CURVE RESOLUTION; NEAR INFRA RED; PHYSICAL PHENOMENA; PLASMA EMISSION; PLASMA EMISSION SPECTROSCOPY; PROCESS ANALYZERS; PROCESS STEPS; PROCESS UNDERSTANDING; PRODUCT CHARACTERIZATIONS; RAMAN SPECTROSCOPIC; UNIVARIATE;

CURING; DEWATERING; EMISSION SPECTROSCOPY; INFRARED DEVICES; LOW TEMPERATURE DRYING; PLASMAS; PRINCIPAL COMPONENT ANALYSIS; PROCESS CONTROL; PROCESS MONITORING; RAMAN SPECTROSCOPY; SPECTROSCOPIC ANALYSIS; TEMPERATURE MEASUREMENT;

INFRARED DRYING;

MANNITOL;

ANALYZER; ARTICLE; COMPLEMENTARY PROCESS ANALYZER; CONTROLLED STUDY; FREEZE DRYING; NEAR INFRARED SPECTROSCOPY; PLASMA EMISSION SPECTROSCOPY; PRINCIPAL COMPONENT ANALYSIS; PROCESS MONITORING; RAMAN SPECTROMETRY; SOLID STATE; SPECTROSCOPY; TEMPERATURE MEASUREMENT;

FREEZE DRYING; MANNITOL; PRINCIPAL COMPONENT ANALYSIS; SPECTROSCOPY, NEAR-INFRARED; SPECTRUM ANALYSIS, RAMAN; TEMPERATURE;

EID: 70349146702     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac9010414     Document Type: Article

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