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Volumn 74, Issue 3, 2009, Pages 839-842
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Optical, dielectric and morphological studies of sol-gel derived nanocrystalline TiO2 films
a
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Author keywords
Chemical synthesis; Dielectric response; Microscopy; Optical properties; Thin films
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Indexed keywords
ATOMIC FORCE MICROSCOPES;
C-V MEASUREMENT;
CHEMICAL SYNTHESIS;
CONDUCTING COATING;
DIELECTRIC CONSTANTS;
DIELECTRIC RESPONSE;
HIGH DIELECTRIC CONSTANTS;
METAL-OXIDE;
MICROSCOPY;
MORPHOLOGICAL STUDY;
NANOCRYSTALLINE TIO;
SILICON SUBSTRATES;
SOL-GEL TECHNIQUE;
TIO;
WAVELENGTH RANGES;
CAPACITANCE;
CAPACITORS;
CERAMIC CAPACITORS;
DIELECTRIC WAVEGUIDES;
GELATION;
GELS;
MORPHOLOGY;
MOS CAPACITORS;
NANOCRYSTALLINE MATERIALS;
OPTICAL COATINGS;
OPTICAL CONSTANTS;
OPTICAL MICROSCOPY;
OPTICAL PROPERTIES;
PERMITTIVITY;
SEMICONDUCTING SILICON;
SOL-GEL PROCESS;
SOL-GELS;
SOLS;
SPECTROSCOPIC ELLIPSOMETRY;
SURFACE ROUGHNESS;
SYNTHESIS (CHEMICAL);
THIN FILMS;
OPTICAL FILMS;
GLASS;
NANOMATERIAL;
SILICON;
TITANIUM;
TITANIUM DIOXIDE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMISTRY;
CRYSTALLIZATION;
OPTICS;
PHASE TRANSITION;
REFRACTOMETRY;
SURFACE PROPERTY;
CRYSTALLIZATION;
GLASS;
MICROSCOPY, ATOMIC FORCE;
NANOSTRUCTURES;
OPTICS AND PHOTONICS;
PHASE TRANSITION;
REFRACTOMETRY;
SILICON;
SURFACE PROPERTIES;
TITANIUM;
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EID: 70249128982
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/j.saa.2009.07.018 Document Type: Article |
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Times cited : (24)
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References (17)
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