-
1
-
-
3142684485
-
Single-crystal metallic nanowires and metal/semiconductor nanowire heterostructures
-
DOI 10.1038/nature02674
-
Y. Wu, J. Xiang, C. Yang, W. Lu, and C. M. Lieber, Nature (London) 0028-0836 430, 61 (2004). 10.1038/nature02674 (Pubitemid 38915222)
-
(2004)
Nature
, vol.430
, Issue.6995
, pp. 61-65
-
-
Wu, Y.1
Xiang, J.2
Yang, C.3
Lu, W.4
Lieber, C.M.5
-
2
-
-
34548390134
-
-
1533-4880,. 10.1166/jnn.2007.732
-
A. Bid, A. Bora, and A. K. Raychaudhuri, J. Nanosci. Nanotechnol. 1533-4880 7, 1867 (2007). 10.1166/jnn.2007.732
-
(2007)
J. Nanosci. Nanotechnol.
, vol.7
, pp. 1867
-
-
Bid, A.1
Bora, A.2
Raychaudhuri, A.K.3
-
3
-
-
33745819983
-
Size-dependent resistivity of nanometric copper wires
-
DOI 10.1103/PhysRevB.74.045411
-
H. Marom, J. Mullin, and M. Eizenberg, Phys. Rev. B 0163-1829 74, 045411 (2006). 10.1103/PhysRevB.74.045411 (Pubitemid 44036738)
-
(2006)
Physical Review B - Condensed Matter and Materials Physics
, vol.74
, Issue.4
, pp. 045411
-
-
Marom, H.1
Mullin, J.2
Eizenberg, M.3
-
4
-
-
84957162876
-
-
0068-6735,. 10.1017/S0305004100019952
-
K. Fuchs, Proc. Cambridge Philos. Soc. 0068-6735 34, 100 (1938). 10.1017/S0305004100019952
-
(1938)
Proc. Cambridge Philos. Soc.
, vol.34
, pp. 100
-
-
Fuchs, K.1
-
5
-
-
84933207793
-
-
0001-8732,. 10.1080/00018735200101151
-
E. H. Sondheimer, Adv. Phys. 0001-8732 1, 1 (1952). 10.1080/ 00018735200101151
-
(1952)
Adv. Phys.
, vol.1
, pp. 1
-
-
Sondheimer, E.H.1
-
6
-
-
25944438622
-
-
0163-1829,. 10.1103/PhysRevB.1.1382
-
A. F. Mayadas and M. Shatzkes, Phys. Rev. B 0163-1829 1, 1382 (1970). 10.1103/PhysRevB.1.1382
-
(1970)
Phys. Rev. B
, vol.1
, pp. 1382
-
-
Mayadas, A.F.1
Shatzkes, M.2
-
7
-
-
34047189739
-
Analysis of the size effect in electroplated fine copper wires and a realistic assessment to model copper resistivity
-
DOI 10.1063/1.2711385
-
W. Zhang, S. H. Brongersma, Z. Li, D. Li, O. Richard, and K. Maex, J. Appl. Phys. 0021-8979 101, 063703 (2007). 10.1063/1.2711385 (Pubitemid 46517014)
-
(2007)
Journal of Applied Physics
, vol.101
, Issue.6
, pp. 063703
-
-
Zhang, W.1
Brongersma, S.H.2
Li, Z.3
Li, D.4
Richard, O.5
Maex, K.6
-
8
-
-
33947502837
-
Four-probe electrical transport measurements on individual metallic nanowires
-
DOI 10.1088/0957-4484/18/6/065204, PII S095744840735842X
-
A. S. Walton, C. S. Allen, K. Critchley, M. L. Gorzny, J. E. McKendry, R. M. D. Brydson, B. J. Hickey, and S. D. Evans, Nanotechnology 0957-4484 18, 065204 (2007). 10.1088/0957-4484/18/6/065204 (Pubitemid 46472340)
-
(2007)
Nanotechnology
, vol.18
, Issue.6
, pp. 065204
-
-
Walton, A.S.1
Allen, C.S.2
Critchley, K.3
Gorzny, M.L.4
McKendry, J.E.5
Brydson, R.M.D.6
Hickey, B.J.7
Evans, S.D.8
-
9
-
-
32044443189
-
Electromigration in self-organized single-crystalline silver nanowires
-
DOI 10.1063/1.2172012, 053122
-
B. Stahlmecke, F. J. M. zu Heringdorf, L. I. Chelaru, M. Horn-von Hoegen, G. Dumpich, and K. R. Roos, Appl. Phys. Lett. 0003-6951 88, 053122 (2006). 10.1063/1.2172012 (Pubitemid 43192075)
-
(2006)
Applied Physics Letters
, vol.88
, Issue.5
, pp. 1-3
-
-
Stahlmecke, B.1
Zu Heringdorf, F.J.M.2
Chelaru, L.I.3
Horn-Von Hoegen, M.4
Dumpich, G.5
Roos, K.R.6
-
10
-
-
24344499101
-
High temperature self-assembly of Ag nanowires on vicinal Si(001)
-
DOI 10.1088/0953-8984/17/16/011
-
K. R. Roos, K. L. Roos, M. H.-v. Hoegen, and F. -J. M. z. Heringdorf, J. Phys.: Condens. Matter 0953-8984 17, S1407 (2005). 10.1088/0953-8984/17/16/011 (Pubitemid 41244590)
-
(2005)
Journal of Physics Condensed Matter
, vol.17
, Issue.16
-
-
Roos, K.R.1
Roos, K.L.2
Horn-Von Hoegen, M.3
Zu Heringdorf, F.J.M.4
-
11
-
-
0000696764
-
-
0031-9007,. 10.1103/PhysRevLett.73.2095
-
T. Michely, M. C. Reuter, M. Copel, and R. M. Tromp, Phys. Rev. Lett. 0031-9007 73, 2095 (1994). 10.1103/PhysRevLett.73.2095
-
(1994)
Phys. Rev. Lett.
, vol.73
, pp. 2095
-
-
Michely, T.1
Reuter, M.C.2
Copel, M.3
Tromp, R.M.4
-
13
-
-
3142716293
-
-
0021-8979,. 10.1063/1.1757655
-
D. Josell, C. Burkhard, Y. Li, Y. W. Cheng, R. R. Keller, C. A. Witt, D. R. Kelley, J. E. Bonevich, B. C. Baker, and T. P. Moffat, J. Appl. Phys. 0021-8979 96, 759 (2004). 10.1063/1.1757655
-
(2004)
J. Appl. Phys.
, vol.96
, pp. 759
-
-
Josell, D.1
Burkhard, C.2
Li, Y.3
Cheng, Y.W.4
Keller, R.R.5
Witt, C.A.6
Kelley, D.R.7
Bonevich, J.E.8
Baker, B.C.9
Moffat, T.P.10
-
14
-
-
0037104274
-
-
0163-1829,. 10.1103/PhysRevB.66.075414
-
W. Steinhogl, G. Schindler, G. Steinlesberger, and M. Engelhardt, Phys. Rev. B 0163-1829 66, 075414 (2002). 10.1103/PhysRevB.66.075414
-
(2002)
Phys. Rev. B
, vol.66
, pp. 075414
-
-
Steinhogl, W.1
Schindler, G.2
Steinlesberger, G.3
Engelhardt, M.4
-
15
-
-
70249121572
-
-
International Conference on Simulation of Semiconductor Processes and Devices, (unpublished)
-
W. Steinhoegl, International Conference on Simulation of Semiconductor Processes and Devices, 2003 (unpublished), pp. 27.
-
(2003)
, pp. 27
-
-
Steinhoegl, W.1
-
16
-
-
0032491770
-
-
0022-3727,. 10.1088/0022-3727/31/1/004
-
X. Y. Qin, L. D. Zhang, G. S. Cheng, X. J. Liu, and D. Jin, J. Phys. D 0022-3727 31, 24 (1998). 10.1088/0022-3727/31/1/004
-
(1998)
J. Phys. D
, vol.31
, pp. 24
-
-
Qin, X.Y.1
Zhang, L.D.2
Cheng, G.S.3
Liu, X.J.4
Jin, D.5
-
19
-
-
4544364454
-
-
0021-4922,. 10.1143/JJAP.9.1326
-
Y. Namba, Jpn. J. Appl. Phys. 0021-4922 9, 1326 (1970). 10.1143/JJAP.9.1326
-
(1970)
Jpn. J. Appl. Phys.
, vol.9
, pp. 1326
-
-
Namba, Y.1
-
20
-
-
4544358607
-
Ultrahigh Strength and High Electrical Conductivity in Copper
-
DOI 10.1126/science.1092905
-
L. Lu, Y. Shen, X. Chen, L. Qian, and K. Lu, Science 0036-8075 304, 422 (2004). 10.1126/science.1092905 (Pubitemid 38499695)
-
(2004)
Science
, vol.304
, Issue.5669
, pp. 422-426
-
-
Lu, L.1
Shen, Y.2
Chen, X.3
Qian, L.4
Lu, K.5
-
21
-
-
59249087749
-
-
(R). 10.1103/PhysRevB.79.041402
-
T. Sun, B. Yao, A. Warren, K. Barmak, M. Toney, R. Peale, and K. Coffey, Phys. Rev. B 79, 041402 (R) (2009). 10.1103/PhysRevB.79.041402
-
(2009)
Phys. Rev. B
, vol.79
, pp. 041402
-
-
Sun, T.1
Yao, B.2
Warren, A.3
Barmak, K.4
Toney, M.5
Peale, R.6
Coffey, K.7
-
22
-
-
70249130630
-
-
See EPAPS supplementary material at E-APPLAB-95-073935 for the derivation of the analytical solution for a trapezoidal wire resistivity.
-
See EPAPS supplementary material at http://dx.doi.org/10.1063/1.3216836 E-APPLAB-95-073935 for the derivation of the analytical solution for a trapezoidal wire resistivity.
-
-
-
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