SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 95, Issue 9, 2009, Pages

Spatial variations in local switching parameters of ferroelectric random access memory capacitors

(4) Wu, D a Kunishima, I b Roberts, S c Gruverman, A c

a NORTH CAROLINA STATE UNIVERSITY (United States)

b TOSHIBA CORPORATION (Japan)

c UNIVERSITY OF NEBRASKA LINCOLN (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE VOLTAGES; DOMAIN PATTERN; FERROELECTRIC RANDOM ACCESS MEMORIES; LOCAL SWITCHING; MICROMETER SCALE; PB(ZR ,TI)O; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION HYSTERESIS; QUASI-STATIC; SCALING EFFECTS; SPATIAL VARIATIONS; SPATIALLY RESOLVED; SUBMICRON; SWITCHING BEHAVIORS; SWITCHING KINETICS;

CAPACITANCE; LEAD; RANDOM ACCESS STORAGE; SWITCHING; ZIRCONIUM;

CAPACITORS;

EID: 69949150118 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3192354 Document Type: Article

Times cited : (15)

References (13)

1
- 0003527147
- (Springer, Berlin).
- J. F. Scott, Ferroelectric Memories (Springer, Berlin, 2000).
- (2000) Ferroelectric Memories
- Scott, J.F.¹

2
- 40849124215
- 0031-9007,. 10.1103/PhysRevLett.100.097601
- A. Gruverman, D. Wu, and J. F. Scott, Phys. Rev. Lett. 0031-9007 100, 097601 (2008). 10.1103/PhysRevLett.100.097601
- (2008) Phys. Rev. Lett. , vol.100 , pp. 097601
- Gruverman, A.¹ Wu, D.² Scott, J.F.³

3
- 0035956096
- Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope
- DOI 10.1063/1.1421638
- S. Tiedke, T. Schmitz, K. Prume, A. Roelofs, T. Schneller, U. Kall, R. Waser, C. S. Ganpule, V. Nagarajan, A. Stanishevsky, and R. Ramesh, Appl. Phys. Lett. 0003-6951 79, 3678 (2001). 10.1063/1.1421638 (Pubitemid 33665901)
- (2001) Applied Physics Letters , vol.79 , Issue.22 , pp. 3678-3680
- Tiedke, S.¹ Schmitz, T.² Prume, K.³ Roelofs, A.⁴ Schneller, T.⁵ Kall, U.⁶ Waser, R.⁷ Ganpule, C.S.⁸ Nagarajan, V.⁹ Stanishevsky, A.¹⁰ Ramesh, R.¹¹

4
- 34848925700
- Observation of inhomogeneous domain nucleation in epitaxial Pb (Zr,Ti) O3 capacitors
- DOI 10.1063/1.2790485
- D. J. Kim, J. Y. Jo, T. H. Kim, S. M. Yang, B. Chen, Y. S. Kim, and T. W. Noh, Appl. Phys. Lett. 0003-6951 91, 132903 (2007). 10.1063/1.2790485 (Pubitemid 47502591)
- (2007) Applied Physics Letters , vol.91 , Issue.13 , pp. 132903
- Kim, D.J.¹ Jo, J.Y.² Kim, T.H.³ Yang, S.M.⁴ Chen, B.⁵ Kim, Y.S.⁶ Noh, T.W.⁷

5
- 0000947202
- 0021-8979,. 10.1063/1.370774
- S. Hong, E. L. Colla, E. Kim, D. V. Taylor, A. K. Tagantsev, P. Muralt, K. No, and N. Setter, J. Appl. Phys. 0021-8979 86, 607 (1999). 10.1063/1.370774
- (1999) J. Appl. Phys. , vol.86 , pp. 607
- Hong, S.¹ Colla, E.L.² Kim, E.³ Taylor, D.V.⁴ Tagantsev, A.K.⁵ Muralt, P.⁶ No, K.⁷ Setter, N.⁸

6
- 32444433547
- Switching spectroscopy piezoresponse force microscopy of ferroelectric materials
- DOI 10.1063/1.2172216
- S. Jesse, A. P. Baddorf, and S. V. Kalinin, Appl. Phys. Lett. 0003-6951 88, 062908 (2006). 10.1063/1.2172216 (Pubitemid 43228528)
- (2006) Applied Physics Letters , vol.88 , Issue.6 , pp. 062908
- Jesse, S.¹ Baddorf, A.P.² Kalinin, S.V.³

7
- 59349113190
- 0003-6951,. 10.1063/1.3070543
- P. Bintachitt, S. Trolier-McKinstry, K. Seal, S. Jesse, and S. V. Kalinin, Appl. Phys. Lett. 0003-6951 94, 042906 (2009). 10.1063/1.3070543
- (2009) Appl. Phys. Lett. , vol.94 , pp. 042906
- Bintachitt, P.¹ Trolier-Mckinstry, S.² Seal, K.³ Jesse, S.⁴ Kalinin, S.V.⁵

8
- 0032307983
- 1058-4587,. 10.1080/10584589808208033
- M. Grossmann, O. Lohse, D. Bolte, R. Waser, W. Hartner, G. Schindler, C. Dehm, N. Nagel, J. Joshi, N. Solayappan, and G. Derbenwick, Integr. Ferroelectr. 1058-4587 22, 95 (1998). 10.1080/10584589808208033
- (1998) Integr. Ferroelectr. , vol.22 , pp. 95
- Grossmann, M.¹ Lohse, O.² Bolte, D.³ Waser, R.⁴ Hartner, W.⁵ Schindler, G.⁶ Dehm, C.⁷ Nagel, N.⁸ Joshi, J.⁹ Solayappan, N.¹⁰ Derbenwick, G.¹¹

9
- 19744382931
- 3 films
- DOI 10.1063/1.1845573, 012902
- I. Stolichnov, L. Malin, E. Colla, A. K. Tagantsev, and N. Setter, Appl. Phys. Lett. 0003-6951 86, 012902 (2005). 10.1063/1.1845573 (Pubitemid 40211585)
- (2005) Applied Physics Letters , vol.86 , Issue.1 , pp. 0129021-0129023
- Stolichnov, I.¹ Malin, L.² Colla, E.³ Tagantsev, A.K.⁴ Setter, N.⁵

10
- 10644268517
- 0947-8396,. 10.1007/s00339-004-2925-2
- B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, and J. S. Cross, Appl. Phys. A: Mater. Sci. Process. 0947-8396 80, 99 (2005). 10.1007/s00339-004-2925-2
- (2005) Appl. Phys. A: Mater. Sci. Process. , vol.80 , pp. 99
- Rodriguez, B.J.¹ Gruverman, A.² Kingon, A.I.³ Nemanich, R.J.⁴ Cross, J.S.⁵

11
- 4344571628
- 0003-6951,. 10.1063/1.1775881
- S. V. Kalinin, A. Gruverman, and D. A. Bonnell, Appl. Phys. Lett. 0003-6951 85, 795 (2004). 10.1063/1.1775881
- (2004) Appl. Phys. Lett. , vol.85 , pp. 795
- Kalinin, S.V.¹ Gruverman, A.² Bonnell, D.A.³

12
- 0001905174
- 3 ferroelectric thin films
- DOI 10.1063/1.121228, PII S0003695198036158
- X. F. Du and I. W. Chen, Appl. Phys. Lett. 0003-6951 72, 1923 (1998). 10.1063/1.121228 (Pubitemid 128671505)
- (1998) Applied Physics Letters , vol.72 , Issue.15 , pp. 1923-1925
- Du, X.¹ Chen, I.-W.²

13
- 0036975212
- 0163-1829,. 10.1103/PhysRevB.66.214109
- A. Tagantsev, I. Stolichnov, N. Setter, J. S. Cross, and M. Tsukada, Phys. Rev. B 0163-1829 66, 214109 (2002). 10.1103/PhysRevB.66.214109
- (2002) Phys. Rev. B , vol.66 , pp. 214109
- Tagantsev, A.¹ Stolichnov, I.² Setter, N.³ Cross, J.S.⁴ Tsukada, M.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.