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Applied Physics Letters

Volumn 95, Issue 9, 2009, Pages

Direct measurement of thermal conductivity of aluminum nanowires

(4) Stojanovic, N a,b Berg, J M a,b Maithripala, D H S c Holtz, M b

a Texas Tech University (United States)

b TEXAS TECH UNIVERSITY (United States)

c UNIVERSITY OF PERADENIYA (Sri Lanka)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX DEVICES; DIRECT MEASUREMENT; ELECTRICAL BRIDGE; ELECTRICAL RESISTIVITY; ELECTRON TRANSPORT EQUATION; FINITE ELEMENT SIMULATIONS; NEAR ROOM TEMPERATURE; RESISTIVITY DATA; SENSOR STRUCTURES; TEST STRUCTURE;

ALUMINA; ALUMINUM; BRIDGE CIRCUITS; ELECTRIC CONDUCTIVITY; ELECTRIC WIRE; NANOWIRES; THERMOANALYSIS; THERMOELECTRICITY;

THERMAL CONDUCTIVITY;

EID: 69949145069 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3216035 Document Type: Article

Times cited : (43)

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