HREM studies of twins in Cd1-xZnxTe (x ≈ 0.04) thin films grown by molecular beam epitaxy

Journal of Alloys and Compounds

Volumn 484, Issue 1-2, 2009, Pages 757-762

  He, Z B ^a   Stolitchnov, I ^a   Setter, N ^a   Cantoni, M ^a   Wojciechowski, T ^b   Karczewski, G ^b  

^a EPFL   (Switzerland)

^b INSTITUTE OF PHYSICS   (Poland)

Author keywords

Domain structure; Semiconductors; TEM; Thin films; Transmission electron microscopy

Indexed keywords

DOMAIN STRUCTURE; HIGH-DENSITY; SEMICONDUCTORS; TEM; TEXTURE DIRECTION; TRIPLE POINTS; TWIN BOUNDARIES; TWIN STRUCTURE;

CRYSTAL GROWTH; CRYSTALS; ELECTRON MICROSCOPY; FERROELECTRICITY; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WIRES; THIN FILMS; Z TRANSFORMS; ZINC;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 69949088148     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.05.036     Document Type: Article

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