High-resolution image simulation of overlap structures in TiAl alloy

Journal of Alloys and Compounds

Volumn 468, Issue 1-2, 2009, Pages 179-186

  Chen, C L ^a,b   Lu, W ^a,b   Cui, Y Y ^a   He, L L ^a   Ye, H Q ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Crystal structural and symmetry; Intermetallics; Scanning and transmission electron microscopy

Indexed keywords

CERIUM ALLOYS; CRYSTAL SYMMETRY; ELECTRON MICROSCOPES; INTERMETALLICS; SCANNING; STACKING FAULTS; TITANIUM ALLOYS; TITANIUM COMPOUNDS;

9R STRUCTURES; EXPERIMENTAL TECHNIQUES; FORMATION MECHANISMS; HIGH RESOLUTIONS; OVERLAP STRUCTURES; PHASE TRANSFORMATIONS; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; TI-AL ALLOYS;

HIGH RESOLUTION ELECTRON MICROSCOPY;

EID: 58049220798     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.01.027     Document Type: Article

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