Probing non-dipole allowed excitations in highly correlated materials with nanoscale resolution

Ultramicroscopy

Volumn 109, Issue 11, 2009, Pages 1333-1337

  Gloter, Alexandre ^a   Chu, Ming Wen ^b   Kociak, Mathieu ^a   Chen, Cheng Hsuan ^b   Colliex, Christian ^a  

^a UNIVERSITÉ PARIS SUD   (France)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Correlated materials; d d excitations; EELS; Optical transition

Indexed keywords

CONVERGENCE ANGLE; CORRELATED MATERIALS; D-D EXCITATIONS; EELS; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ELECTRON PROBE; HIGHLY-CORRELATED; NANO SCALE; NANOSCALE RESOLUTIONS; NON-DIPOLE; SCANNING TRANSMISSION ELECTRON MICROSCOPES; STRONGLY CORRELATED MATERIALS; TRANSFERRED MOMENTUM; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRON MICROSCOPES; ELECTRONS; ENERGY DISSIPATION; LIGHT TRANSMISSION; NANOSTRUCTURED MATERIALS; OPTICAL TRANSITIONS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; CORRELATION ANALYSIS; DIPOLE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTROSTIMULATION; EXCITATION; IMAGE ANALYSIS; IMAGE DISPLAY; MAGNETISM; NANOIMAGING; NANOPROBE; STATISTICAL ANALYSIS; STATISTICAL PARAMETERS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 69749124035     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.06.005     Document Type: Article

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