Electron-hole excitations in NiO: LSDA+U-based calculations vs. inelastic X-ray scattering and ellipsometry measurements

Journal of Physics and Chemistry of Solids

Volumn 66, Issue 12, 2005, Pages 2281-2289

  Eguiluz, A G ^a,b   Restrepo, O D ^a,b   Larson, B C ^b   Tischler, J Z ^b   Zschack, P ^c   Jellison, G E ^b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CORRELATION METHODS; ELECTRONIC STRUCTURE; ELECTRONS; ELLIPSOMETRY; HOLE MOBILITY; RESONANCE; X RAY SCATTERING;

CORRELATED MATERIALS; ELECTRON-HOLE; ELLIPSOMETRY MEASUREMENTS; NIO OPTICAL GAP; RANDOM-PHASE;

NICKEL COMPOUNDS;

EID: 29144464252     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2005.09.092     Document Type: Conference Paper

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