Conduction-atomic force microscopy study of H2 sensing mechanism in Pd nanoparticles decorated TiO2 nanofilm

Journal of Applied Physics

Volumn 106, Issue 4, 2009, Pages

  Kumar, Manippady Krishna ^a   Tan, Lee Kheng ^a   Gosvami, Nitya Nanda ^b   Gao, Han ^a  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ELECTRICAL CONDUCTION; ELECTRONIC SENSITIZATION; HYDROGEN GAS; HYDROGEN SENSOR; IN-SITU; NANO FILMS; PD NANO PARTICLE; RESPONSE MECHANISMS; ROOM TEMPERATURE; SENSING MECHANISM; TIO; WALL THICKNESS;

ATOMIC FORCE MICROSCOPY; ATOMS; CHEMICAL SENSORS; HYDROGEN; PALLADIUM;

NANOPARTICLES;

EID: 69749098466     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3202344     Document Type: Article

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