|
Volumn 5, Issue 6, 2008, Pages 1508-1511
|
Deep centers in semi-insulating Fe-doped native GaN substrates grown by hydride vapour phase epitaxy
|
Author keywords
[No Author keywords available]
|
Indexed keywords
A-CENTER;
ELECTRICAL PROPERTY;
FE-DOPED;
GAN SUBSTRATE;
HALL EFFECT MEASUREMENT;
HIGH RESISTIVITY;
HYDRIDE VAPOR PHASE EPITAXY;
HYDRIDE VAPOUR PHASE EPITAXIES;
SECONDARY ION MASS SPECTROSCOPY;
SEMI-INSULATING;
TEMPERATURE DEPENDENT;
THERMALLY STIMULATED CURRENT SPECTROSCOPY;
WHITE-LIGHT ILLUMINATION;
CRYSTAL GROWTH;
ELECTRIC PROPERTIES;
GALLIUM NITRIDE;
SECONDARY ION MASS SPECTROMETRY;
SILICON WAFERS;
VAPOR PHASE EPITAXY;
GALLIUM ALLOYS;
|
EID: 69649097633
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200778430 Document Type: Conference Paper |
Times cited : (17)
|
References (8)
|