Dislocations, crystallite size, and planar faults in nanocrystalline ceria

Powder Diffraction

Volumn 24, Issue 3, 2009, Pages 228-233

  Aghdaee, S R ^a   Soleimanian, V ^a  

^a IRAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Iran)

Author keywords

Anisotropic line broadening; Crystallite size; Dislocation density

Indexed keywords

ANISOTROPIC LINE BROADENING; CERIUM OXIDES; DISLOCATION DENSITIES; NANOCRYSTALLINES; PLANAR FAULT; WILLIAMSON-HALL; WILLIAMSON-HALL PLOT; X-RAY DIFFRACTION LINE BROADENING;

ANISOTROPY; CERIUM COMPOUNDS; X RAY DIFFRACTION;

CRYSTALLITE SIZE;

EID: 69549134027     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.3187210     Document Type: Article

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