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Volumn 23, Issue 1, 2008, Pages 41-51
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Comparison methods of variance and line profile analysis for the evaluation of microstructures of materials
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Author keywords
Line broadening; Microstructure; X ray diffraction (XRD)
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Indexed keywords
COMPARISON METHODS;
DIFFRACTION LINES;
LINE BROADENING;
LINE PROFILE ANALYSIS;
POWDER DIFFRACTION;
PSEUDO-VOIGT FUNCTIONS;
ROOT MEAN SQUARE;
STANDARD UNCERTAINTY;
CRYSTALLITE SIZE;
FOURIER ANALYSIS;
MICROSTRUCTURE;
STRAIN;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
RIETVELD REFINEMENT;
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EID: 40149100993
PISSN: 08857156
EISSN: 19457413
Source Type: Journal
DOI: 10.1154/1.2888763 Document Type: Article |
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Times cited : (10)
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References (29)
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