-
1
-
-
69349097454
-
Technological study of a module IGBT for an aeronautical application in engine zone
-
Dresden, Germany;
-
Lhommeau T, Meuret R, Karama M. Technological study of a module IGBT for an aeronautical application in engine zone. In: Proc of EPE Dresden, Germany; 2005.
-
(2005)
Proc of EPE
-
-
Lhommeau, T.1
Meuret, R.2
Karama, M.3
-
2
-
-
0002534367
-
Reliability of high power IGBT modules - testing on thermal fatigue effects due to traction cycles
-
Hamidi A, Coquery G, Lallemand R. Reliability of high power IGBT modules - testing on thermal fatigue effects due to traction cycles. In: Proc of EPE; 1997. p. 3118-23.
-
(1997)
Proc of EPE
, pp. 3118-3123
-
-
Hamidi, A.1
Coquery, G.2
Lallemand, R.3
-
3
-
-
69349097454
-
Technological study of a module IGBT for an aeronautical application in engine zone
-
Dresden, Germany;
-
Lhommeau T, Meuret R, Karama M. Technological study of a module IGBT for an aeronautical application in engine zone. In: Proc of EPE, Dresden, Germany; 2005.
-
(2005)
Proc of EPE
-
-
Lhommeau, T.1
Meuret, R.2
Karama, M.3
-
4
-
-
34548736004
-
Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications
-
ESREF
-
Lhommeau T, Perpina X, Martin C, Meuret R, Mermet-Guyennet M, Karama M. Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications. Microelectron Reliab; 2007 [special issue ESREF].
-
(2007)
Microelectron Reliab
, Issue.SPEC. ISSUE
-
-
Lhommeau, T.1
Perpina, X.2
Martin, C.3
Meuret, R.4
Mermet-Guyennet, M.5
Karama, M.6
-
5
-
-
69349089006
-
-
US Department of Defense. MIL-STD-883 F; 1996.
-
US Department of Defense. MIL-STD-883 F; 1996.
-
-
-
-
6
-
-
0036132248
-
Low cycle fatigue test for solders using non-contact digital image measurement system
-
Kanchanomai C., Yamamoto S., Miyashita Y., Muthoh Y., and Mcevily A.J. Low cycle fatigue test for solders using non-contact digital image measurement system. Int J Fatigue 24 1 (2002) 57-67
-
(2002)
Int J Fatigue
, vol.24
, Issue.1
, pp. 57-67
-
-
Kanchanomai, C.1
Yamamoto, S.2
Miyashita, Y.3
Muthoh, Y.4
Mcevily, A.J.5
-
7
-
-
69349092210
-
-
Abaqus user's manual ver 6.8. Hibbitt, Karlsson & Sorensen, Inc. HKS; 2008.
-
Abaqus user's manual ver 6.8. Hibbitt, Karlsson & Sorensen, Inc. HKS; 2008.
-
-
-
-
8
-
-
0033147347
-
Reliability of AIN substrates and their solder joints in IGBT power modules
-
Mitic G., Beinert R., Klofac P., Schultz H.J., and Lefranc G. Reliability of AIN substrates and their solder joints in IGBT power modules. Microelectron Reliab 39 (1999) 1159-1164
-
(1999)
Microelectron Reliab
, vol.39
, pp. 1159-1164
-
-
Mitic, G.1
Beinert, R.2
Klofac, P.3
Schultz, H.J.4
Lefranc, G.5
-
9
-
-
33747750172
-
Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling
-
Dupont L., Khatir Z., Lefebvre S., and Bontemps S. Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling. Microelectron Reliab 46 (2006) 1766-1771
-
(2006)
Microelectron Reliab
, vol.46
, pp. 1766-1771
-
-
Dupont, L.1
Khatir, Z.2
Lefebvre, S.3
Bontemps, S.4
-
10
-
-
2442527850
-
Boundary element analysis of thermal fatigue effects on high power IGBT modules
-
Khatir Z., and Lefebvre S. Boundary element analysis of thermal fatigue effects on high power IGBT modules. Microelectron Reliab 44 (2004) 929-938
-
(2004)
Microelectron Reliab
, vol.44
, pp. 929-938
-
-
Khatir, Z.1
Lefebvre, S.2
-
11
-
-
69349083726
-
-
Dupont L. tude de modules semi-conducteurs de puissance dans une ambiance chaude pour des applications de transports ariens et automobiles. Thesis, cole Normale Suprieure de Cachan, juin; 2006.
-
Dupont L. tude de modules semi-conducteurs de puissance dans une ambiance chaude pour des applications de transports ariens et automobiles. Thesis, cole Normale Suprieure de Cachan, juin; 2006.
-
-
-
-
12
-
-
0036287853
-
Improvement of fatigue life of solder joints by thickness control of solder with wire bump technique
-
San Diego, USA;
-
Hayashi K, Izuta G, Murakami K, Uegai Y, Takao H. Improvement of fatigue life of solder joints by thickness control of solder with wire bump technique. In: Proc of ECTC, San Diego, USA; 2002. p. 1469-74.
-
(2002)
Proc of ECTC
, pp. 1469-1474
-
-
Hayashi, K.1
Izuta, G.2
Murakami, K.3
Uegai, Y.4
Takao, H.5
-
13
-
-
0024684623
-
Surface-mount attachment reliability of clip-leaded ceramic chip carriers on FR-4 circuit boards
-
Engelmaier W., and Attarwala A.I. Surface-mount attachment reliability of clip-leaded ceramic chip carriers on FR-4 circuit boards. IEEE Trans Compon Hybrids Manufact Technol 12 (1989) 284-296
-
(1989)
IEEE Trans Compon Hybrids Manufact Technol
, vol.12
, pp. 284-296
-
-
Engelmaier, W.1
Attarwala, A.I.2
-
14
-
-
69349083611
-
Lifetime prediction of SnPb and SnAgCu solder joints of chips on copper substrate based on crack propagation FE-analysis
-
Milano, Italy;
-
Dplanque S, Nchter W, Wunderle B, Schacht R, Michel B. Lifetime prediction of SnPb and SnAgCu solder joints of chips on copper substrate based on crack propagation FE-analysis. In: Proc of EUROSIME, Milano, Italy; 2006.
-
(2006)
Proc of EUROSIME
-
-
Dplanque, S.1
Nchter, W.2
Wunderle, B.3
Schacht, R.4
Michel, B.5
-
15
-
-
65649116246
-
Reliability of lead-free solder in power module with stochastic uncertainty
-
Micol A., Martin C., Dalverny O., Mermet-Guyennet M., and Karama M. Reliability of lead-free solder in power module with stochastic uncertainty. Microelectron Reliab 49 (2009) 631-641
-
(2009)
Microelectron Reliab
, vol.49
, pp. 631-641
-
-
Micol, A.1
Martin, C.2
Dalverny, O.3
Mermet-Guyennet, M.4
Karama, M.5
-
16
-
-
35648968617
-
Board level drop test and simulation of leaded and lead-free BGA-PCB assembly
-
Qu X., Chen Z., Qi B., Lee T., and Wang J. Board level drop test and simulation of leaded and lead-free BGA-PCB assembly. Microelectron Reliab 47 12 (2007) 2197-2204
-
(2007)
Microelectron Reliab
, vol.47
, Issue.12
, pp. 2197-2204
-
-
Qu, X.1
Chen, Z.2
Qi, B.3
Lee, T.4
Wang, J.5
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