Modeling of H 2 O adsorption-induced curvature of a metal/silicon nanocantilever

Applied Surface Science

Volumn 255, Issue 23, 2009, Pages 9404-9408

  Yu, Hong ^a   Huang, Qing An ^a   Liu, Xiao Xiao ^a  

^a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

Adsorption; Nanocantilever; Potential; Stress

Indexed keywords

MOLECULAR DYNAMICS; NANOCANTILEVERS; NANOSTRUCTURED MATERIALS; SOFTWARE TESTING; STRESSES;

ATOMIC AND MOLECULAR INTERACTION; ELASTIC ENERGY; MINIMUM VALUE; MOLECULAR DYNAMICS METHODS; POTENTIAL; SIMPLE METHOD; SUBSTRATE TRANSFER; THEORETICAL VALUES;

ADSORPTION;

EID: 69249230773     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.07.043     Document Type: Article

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