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Current Applied Physics

Volumn 10, Issue 1, 2010, Pages 355-358

Lateral force microscopy in low normal force limit

(3) Lee, Hyunsoo a Lee, Naesung a Seo, Yongho a

a Sejong University (South Korea)

Author keywords

Atomic force microscopy; Cantilever; Frictional force; Lateral force microscopy

Indexed keywords

ATTRACTIVE FORCE; CALIBRATION METHOD; CANTILEVER; FRICTIONAL FORCE; FRICTIONAL FORCES; LATERAL FORCE; LATERAL FORCE MICROSCOPY; NORMAL FORCES; RECTANGULAR HOLES; SI SURFACES;

ATOMS; FRICTION; NANOCANTILEVERS; SILICON NITRIDE; VAN DER WAALS FORCES;

ATOMIC FORCE MICROSCOPY;

EID: 69249217779 PISSN: 15671739 EISSN: None Source Type: Journal
DOI: 10.1016/j.cap.2009.06.027 Document Type: Article

Times cited : (3)

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