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Volumn 30, Issue 7, 2009, Pages 1347-1352

Online fault monitoring for batch processes based on adaptive multi-model ICA-SVDD

Author keywords

Adaptive multi model; ICA SVDD; MPCA; Non Gaussian; Online fault monitoring

Indexed keywords

ADAPTIVE MULTI-MODEL; ICA -SVDD; MPCA; NON-GAUSSIAN; ONLINE FAULT MONITORING;

EID: 69249215507     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (12)

References (14)
  • 1
    • 0029252734 scopus 로고
    • Multivariate SPC charts for monitoring batch process
    • NOMIKOS P, MACGREGOR J F. Multivariate SPC charts for monitoring batch process[J]. Technometrics, 1995, 37: 41-59.
    • (1995) Technometrics , vol.37 , pp. 41-59
    • Nomikos, P.1    Macgregor, J.F.2
  • 2
    • 0028483476 scopus 로고
    • Monitoring batch processes using multiway principal component analysis
    • NOMIKOS P, MACGREGOR J F. Monitoring batch processes using multiway principal component analysis[J]. AIChE J., 1994, 40: 1361-1375.
    • (1994) AIChE J. , vol.40 , pp. 1361-1375
    • Nomikos, P.1    Macgregor, J.F.2
  • 3
    • 0037394190 scopus 로고    scopus 로고
    • Monitoring independent components for fault detection
    • KANO M, TANAKA S, HASEBE S, et al. Monitoring independent components for fault detection[J]. AIChE J., 2003, 49: 969-976.
    • (2003) AIChE J. , vol.49 , pp. 969-976
    • Kano, M.1    Tanaka, S.2    Hasebe, S.3
  • 4
    • 1342285571 scopus 로고    scopus 로고
    • Statistical process monitoring with independent component analysis
    • LEE J M, YOO C K, LEE I B. Statistical process monitoring with independent component analysis[J]. J. Process Control, 2004, 14: 467-485.
    • (2004) J. Process Control , vol.14 , pp. 467-485
    • Lee, J.M.1    Yoo, C.K.2    Lee, I.B.3
  • 5
    • 2342615505 scopus 로고    scopus 로고
    • On-line monitoring of batch process using multiway independent component analysis
    • YOO C K, LEE J M, VANROLLEGHEM P A, et al. On-line monitoring of batch process using multiway independent component analysis[J]. Chemometrics and Intelligent Laboratory Systems, April, 2004, 71(1): 151-163.
    • (2004) Chemometrics and Intelligent Laboratory Systems , vol.71 , Issue.1 , pp. 151-163
    • Yoo, C.K.1    Lee, J.M.2    Vanrolleghem, P.A.3
  • 9
    • 0942266514 scopus 로고    scopus 로고
    • Support vector domain description
    • TAX D M J, DUIN R P W. Support vector domain description[J]. Machine Learning, 2004, 54: 45-66.
    • (2004) Machine Learning , vol.54 , pp. 45-66
    • Tax, D.M.J.1    Duin, R.P.W.2
  • 10
    • 33744995034 scopus 로고    scopus 로고
    • Low resolution face recognition based on support vector data description
    • LEE S W, PARK J Y, LEE S W. Low resolution face recognition based on support vector data description[J]. Pattern Recognition, 2006, 39: 1809-1812.
    • (2006) Pattern Recognition , vol.39 , pp. 1809-1812
    • Lee, S.W.1    Park, J.Y.2    Lee, S.W.3
  • 11
    • 65349170020 scopus 로고    scopus 로고
    • New monitoring method for dynamic non-Gaussian process
    • WANG P L, YAN W J. New monitoring method for dynamic non-Gaussian process[J]. Chinese Journal of Scientific Instrument, 2009, 30(3): 471-476.
    • (2009) Chinese Journal of Scientific Instrument , vol.30 , Issue.3 , pp. 471-476
    • Wang, P.L.1    Yan, W.J.2
  • 12
    • 0042826822 scopus 로고    scopus 로고
    • Independent component analysis: Algorithms and applications
    • HYVARINEN A, OJA E. Independent component analysis: algorithms and applications[J]. Neural Network, 2000, 13: 411-430.
    • (2000) Neural Network , vol.13 , pp. 411-430
    • Hyvarinen, A.1    Oja, E.2
  • 13
    • 34247109083 scopus 로고    scopus 로고
    • Process monitoring based on independent component analysis-principal component analysis (ICA-PCA) and similarity factors
    • GE Z Q, SONG Z H. Process monitoring based on independent component analysis-principal component analysis (ICA-PCA) and similarity factors[J]. Ind. Eng. Chem. Res., 2007, 46: 2054-2063.
    • (2007) Ind. Eng. Chem. Res. , vol.46 , pp. 2054-2063
    • Ge, Z.Q.1    Song, Z.H.2
  • 14
    • 0001067412 scopus 로고    scopus 로고
    • A comparison of principal component analysis, multiway principal component analysis, trilinear decomposition and parallel factor analysis for fault detection in a semiconductor etch process
    • WISE B M, GALLAGHER N B, BUTLER S W, et al. A comparison of principal component analysis, multiway principal component analysis, trilinear decomposition and parallel factor analysis for fault detection in a semiconductor etch process[J]. J. Chemometrics, 1999, 13: 379-396.
    • (1999) J. Chemometrics , vol.13 , pp. 379-396
    • Wise, B.M.1    Gallagher, N.B.2    Butler, S.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.