New monitoring method for dynamic non-Gaussian process

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 30, Issue 3, 2009, Pages 471-476

  Wang, Peiliang ^a,b   Yan, Wenjun ^b  

^a HUZHOU UNIVERSITY   (China)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

Correlation analysis; Dynamic PCA; Non Gaussian; SVDD

Indexed keywords

CORRELATION ANALYSIS; DYNAMIC DATUM; DYNAMIC PRINCIPAL COMPONENT ANALYSIS; INDUSTRIAL PROCESS; MONITORING METHODS; NON-GAUSSIAN; NON-GAUSSIAN PROCESS; PRINCIPAL COMPONENTS; PROCESS DATUM; PROCESS DYNAMICS; PROCESS INFORMATIONS; PROCESS VARIABLES; RESIDUAL SUBSPACES; SUPPORT VECTOR DATA DESCRIPTIONS; SVDD; TENNESSEE EASTMAN;

DYNAMIC ANALYSIS; GAUSSIAN DISTRIBUTION; GAUSSIAN NOISE (ELECTRONIC); PROCESS MONITORING; REGRESSION ANALYSIS;

PRINCIPAL COMPONENT ANALYSIS;

EID: 65349170020     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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