Evolution of chemical structure during silver photodiffusion into chalcogenide glass thin films

Journal of Non-Crystalline Solids

Volumn 355, Issue 37-42, 2009, Pages 1924-1929

  Kovalskiy, A ^a   Jain, H ^a   Mitkova, M ^b  

^a Lehigh University   (United States)

^b Boise State University   (United States)

Author keywords

Chalcogenides; XPS

Indexed keywords

AG DIFFUSION; ARSENIC OXIDE; CHALCOGENIDE GLASS; CHEMICAL COMPOSITIONS; CHEMICAL STRUCTURE; CORE LEVELS; HIGH RESOLUTION; MODEL MATERIALS; PHOTO-INDUCED; REFERENCE POINTS; SILVER DIFFUSION; SILVER LAYER; SURFACE OXYGEN; TERNARY PHASE; TETRAHEDRAL STRUCTURAL UNITS; THIN GOLD FILM; VALENCE BAND SPECTRA; XPS;

ARSENIC; BINDING ENERGY; CHALCOGENIDES; DIFFUSION; ETHANE; GERMANIUM; GOLD DEPOSITS; OPTICAL GLASS; OXYGEN; PHASE CHANGE MEMORY; PHASE SEPARATION; SEMICONDUCTING SELENIUM COMPOUNDS; STRUCTURE (COMPOSITION); SURFACES; THIN FILMS; THREE DIMENSIONAL; X RAY PHOTOELECTRON SPECTROSCOPY;

SILVER;

EID: 69249094257     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.12.021     Document Type: Article

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