Numerical analysis of the propagation properties of subwavelength semiconductor slit in the terahertz region

Optics Express

Volumn 17, Issue 17, 2009, Pages 15359-15371

  He, Xiao Yong ^a  

^a HENAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIAGNOSIS; DIELECTRIC MATERIALS; GEOMETRY; TERAHERTZ WAVES; TRANSFER MATRIX METHOD;

BIOLOGICAL SPECIMENS; EFFECTIVE INDEX; ELECTRIC ENERGIES; PROPAGATION CONSTANT; PROPAGATION LENGTHS; PROPAGATION PROPERTIES; SLIT STRUCTURES; TERAHERTZ REGION;

CARRIER CONCENTRATION;

WATER;

ALGORITHM; ARTICLE; CHEMISTRY; COMPUTER SIMULATION; DIAGNOSTIC IMAGING; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; OPTICAL INSTRUMENTATION; OPTICS; REFRACTOMETRY; SEMICONDUCTOR; SURFACE PLASMON RESONANCE; TEMPERATURE; TERAHERTZ RADIATION; TERAHERTZ SPECTROSCOPY; THEORETICAL MODEL;

ALGORITHMS; COMPUTER SIMULATION; DIAGNOSTIC IMAGING; EQUIPMENT DESIGN; MODELS, THEORETICAL; OPTICAL DEVICES; OPTICS AND PHOTONICS; REFRACTOMETRY; SEMICONDUCTORS; SURFACE PLASMON RESONANCE; TEMPERATURE; TERAHERTZ RADIATION; TERAHERTZ SPECTROSCOPY; WATER;

EID: 69049098938     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.015359     Document Type: Article

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