Development of mid-infrared surface plasmon resonance-based sensors with highly-doped silicon for biomedical and chemical applications

Optics Express

Volumn 17, Issue 5, 2009, Pages 3130-3140

  Chen, Yu Bin ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED DEVICES; OPTICAL CONSTANTS; PLASMONS; SEMICONDUCTOR DOPING; SILICON;

ANGLE OF INCIDENCE; CHEMICAL APPLICATIONS; CHEMICAL SOLUTIONS; DIRECTIONAL REFLECTANCES; DOPING CONCENTRATION; MID-INFRARED RANGE; RIGOROUS COUPLED WAVE ANALYSIS; SENSOR PERFORMANCE;

SURFACE PLASMON RESONANCE;

SILICON;

ARTICLE; EQUIPMENT DESIGN; INFRARED SPECTROPHOTOMETRY; INSTRUMENTATION; LIGHT RELATED PHENOMENA; METHODOLOGY; STATISTICS; SURFACE PLASMON RESONANCE;

EQUIPMENT DESIGN; OPTICAL PHENOMENA; SILICON; SPECTROPHOTOMETRY, INFRARED; SURFACE PLASMON RESONANCE;

EID: 61549090213     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.003130     Document Type: Article

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