SCOPUS 정보 검색 플랫폼

X-Ray Spectrometry

Volumn 28, Issue 5, 1999, Pages 342-347

Mathematical model for evaluation of surface analysis data by total reflection XRF

(4) Pérez, Roberto D a Sánchez, Héctor J a Rubio, Marcelo b Pérez, Carlos A c

a UNIVERSIDAD NACIONAL DE CÓRDOBA (Argentina)

b Gobierno de Córdoba (Argentina)

c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; MATRIX ALGEBRA; SILICON WAFERS; SURFACE ANALYSIS;

GRAZING EXIT; GRAZING INCIDENCE; MATHEMATICAL TOOLS; MATRIX APPROACH; MODEL USE; PHYSICAL PROCESS; STRATIFIED MEDIA; THEORETICAL MODELING; TOTAL REFLECTION; X RAY FLUORESCENCE;

ELECTRIC FIELDS;

EID: 0042440507 PISSN: 00498246 EISSN: None Source Type: Journal
DOI: 10.1002/(SICI)1097-4539(199909/10)28:5<342::AID-XRS360>3.0.CO;2-J Document Type: Article

Times cited : (8)

References (14)

1
- 85159246555
- Y. C. Sasaki, Y. Suzuki, Y. Tomioka and T. Ishibashi, Phys. Rev. B 50, 1516 (1994).
- (1994) Phys. Rev. B , vol.50 , pp. 1516
- Sasaki, Y.C.¹ Suzuki, Y.² Tomioka, Y.³ Ishibashi, T.⁴

2
- 0028766957
- Y. C. Sasaki, Y. Suzuki and T. Ishibashi, Science 263, 62 (1994).
- (1994) Science , vol.263 , pp. 62
- Sasaki, Y.C.¹ Suzuki, Y.² Ishibashi, T.³

3
- 0347305828
- P. K. de Bokx and H. P. Urbach, Rev. Sci. Instrum. 66, 15 (1994).
- (1994) Rev. Sci. Instrum. , vol.66 , pp. 15
- De Bokx, P.K.¹ Urbach, H.P.²

4
- 0001116041
- W. B. Yun and J. M. Bloch, J. Appl. Phys. 68, 1421 (1990).
- (1990) J. Appl. Phys. , vol.68 , pp. 1421
- Yun, W.B.¹ Bloch, J.M.²

5
- 44949281018
- D. K. G. Boer and W. W. Hoogenhof, Spectrochim. Acta part B 46, 1323 (1991).
- (1991) Spectrochim. Acta Part B , vol.46 , pp. 1323
- Boer, D.K.G.¹ Hoogenhof, W.W.²

6
- 0026258448
- U. Weisbrod, R. Gutschke, J. Knoth and H. Schwenke, Appl. Phys. A 53, 449 (1991).
- (1991) Appl. Phys. A , vol.53 , pp. 449
- Weisbrod, U.¹ Gutschke, R.² Knoth, J.³ Schwenke, H.⁴

7
- 0003882610
- Springer, New York
- J. Stoer and R. Bulirsch, Introduction to Numerical Analysis. Springer, New York (1980).
- (1980) Introduction to Numerical Analysis
- Stoer, J.¹ Bulirsch, R.²

8
- 0003960319
- Prentice-Hall, Englewood Chiffs, NJ
- B. Noble and J. W. Daniel, Applied Linear Algebra. Prentice-Hall, Englewood Chiffs, NJ (1988).
- (1988) Applied Linear Algebra
- Noble, B.¹ Daniel, J.W.²

9
- 85159252847
- R. D. Pérez, H. J. Sánchez and M. Rubio, presented at the VIth Latin-American Seminar on X-Ray Techniques, 1998.
- (1998) Vith Latin-american Seminar on X-ray Techniques
- Pérez, R.D.¹ Sánchez, H.J.² Rubio, M.³

10
- 0003952728
- McGraw-Hill, New York
- P. M. Morse and H. Feshbach, Methods of Theoretical Physics. McGraw-Hill, New York (1953).
- (1953) Methods of Theoretical Physics
- Morse, P.M.¹ Feshbach, H.²

11
- 0003724744
- Pergamon press, Oxford
- L. D. Landau and E. M. Lifschitz, Electrodynamics of Continuous Media. Pergamon press, Oxford (1981).
- (1981) Electrodynamics of Continuous Media
- Landau, L.D.¹ Lifschitz, E.M.²

12
- 0003972070
- Pergamon press, New York
- M. Born and E. Wolf, Principles of Optics. Pergamon press, New York (1980).
- (1980) Principles of Optics
- Born, M.¹ Wolf, E.²

13
- 0041850620
- R. D. Pérez and H. J. Sánchez, Rev. Sci. Instrum. 68, 2681 (1997).
- (1997) Rev. Sci. Instrum. , vol.68 , pp. 2681
- Pérez, R.D.¹ Sánchez, H.J.²

14
- 0030249829
- H. J. Sánchez, C. A. Pérez, R. D. Pérez and M. Rubio, Radiat. Phys. Chem. 48, 325 (1996).
- (1996) Radiat. Phys. Chem. , vol.48 , pp. 325
- Sánchez, H.J.¹ Pérez, C.A.² Pérez, R.D.³ Rubio, M.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.