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Volumn 430, Issue 1, 1999, Pages 146-153

Morphology and composition of Au films on Si(100)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; MORPHOLOGY; PHASE TRANSITIONS; SEMICONDUCTING SILICON; SILVER; SURFACE STRUCTURE;

EID: 0032655880     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00428-8     Document Type: Article
Times cited : (10)

References (19)
  • 9
    • 0001940245 scopus 로고
    • Electron Spectroscopy for Surface Analysis Ibach H.
    • Berlin: Springer
    • Henzler M. Electron Spectroscopy for Surface Analysis. Ibach H. Topics in Current Physics. 4:1977;117 Springer, Berlin.
    • (1977) Topics in Current Physics , vol.4 , pp. 117
    • Henzler, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.