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Volumn 430, Issue 1, 1999, Pages 146-153
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Morphology and composition of Au films on Si(100)
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
AUGER ELECTRON SPECTROSCOPY;
LOW ENERGY ELECTRON DIFFRACTION;
METALLIC FILMS;
MORPHOLOGY;
PHASE TRANSITIONS;
SEMICONDUCTING SILICON;
SILVER;
SURFACE STRUCTURE;
LOW ENERGY ION SCATTERING;
SILICIDE;
SURFACES;
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EID: 0032655880
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00428-8 Document Type: Article |
Times cited : (10)
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References (19)
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