Mapping and load response of overload strain fields: Synchrotron X-ray measurements

International Journal of Fatigue

Volumn 31, Issue 11-12, 2009, Pages 1669-1677

  Croft, M ^a,b   Shukla, V ^c   Jisrawi, N M ^c,d   Zhong, Z ^b   Sadangi, R K ^c   Holtz, R L ^e   Pao, P S ^e   Horvath, K ^a   Sadananda, K ^f   Ignatov, A ^c   Skaritka, J ^b   Tsakalakos, T ^c  

^a RUTGERS UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c Piscataway   (United States)

^d UNIVERSITY OF SHARJAH   (United Arab Emirates)

^e NAVAL RESEARCH LABORATORY   (United States)

^f Technical Data Analysis Inc   (United States)

Author keywords

Fatigue; Overload; Strain; Synchrotron; X ray

Indexed keywords

2D STRAIN; 4140 STEEL; COMPRESSIVE STRAIN; CRACK FACES; CRACK GROWTH RATES; CRACK GROWTH RETARDATION; CRACK PLANE; CRITICAL THRESHOLD; ELECTRON DISCHARGE; FATIGUE; FATIGUE CRACK GROWTH; FATIGUE CRACKS; HIGH ENERGY SYNCHROTRON; IN-SITU LOADING; IN-SITU TENSILE; LOAD RESPONSE; LOCAL STRAINS; OVERLOAD; OVERLOAD EFFECTS; SINGLE OVERLOADS; STRAIN CHANGE; STRAIN FIELDS; STRAIN RESPONSE; SYNCHROTRON X-RAY MEASUREMENT; TENSILE RESIDUALS; X-RAY;

CRACK TIPS; CRACKING (CHEMICAL); FATIGUE CRACK PROPAGATION; FATIGUE OF MATERIALS; MAPPING; SYNCHROTRONS;

STRAIN RATE;

EID: 68949112100     PISSN: 01421123     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijfatigue.2009.01.020     Document Type: Article

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