Ballistic versus electronic processes in ion-induced nanostructuring of ionic surfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 23, 2009, Pages

  Krok, F ^a   Saeed, S R ^a   Postawa, Z ^a   Szymonski, M ^a  

^a JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 68949094415     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.235432     Document Type: Article

References (35)

1. W. L. Chan and E. Chason, J. Appl. Phys. 101, 121301 (2007). 10.1063/1.2749198
2. G. Costantini, F. Buatier de Mongeot, C. Boragno, and U. Valbusa, Phys. Rev. Lett. 86, 838 (2001). 10.1103/PhysRevLett.86.838
3. U. Valbusa, C. Boragno, and F. Buatier de Mongeot, J. Phys.: Condens. Matter 14, 8153 (2002). 10.1088/0953-8984/14/35/301
4. G. Carter and V. Vishnyakov, Phys. Rev. B 54, 17647 (1996). 10.1103/PhysRevB.54.17647
5. A.-D. Brown and J. Erlebacher, Phys. Rev. B 72, 075350 (2005). 10.1103/PhysRevB.72.075350
6. E. Chason, T. M. Mayer, B. K. Kellerman, D. T. McIlroy, and A. J. Howard, Phys. Rev. Lett. 72, 3040 (1994). 10.1103/PhysRevLett.72.3040
7. D. Carbone, A. Alija, O. Plantevin, R. Gago, S. Facsko, and T. H. Metzger, Nanotechnology 19, 035304 (2008). 10.1088/0957-4484/19/03/035304
8. B. Ziberi, F. Frost, M. Tartz, H. Neumann, and B. Rauschenbach, Appl. Phys. Lett. 92, 063102 (2008). 10.1063/1.2841641
9. T. M. Mayer, E. Chason, and A. J. Howard, J. Appl. Phys. 76, 1633 (1994). 10.1063/1.357748
10. R. M. Bradley and J. M. Harper, J. Vac. Sci. Technol. A 6, 2390 (1988). 10.1116/1.575561
11. P. Sigmund, J. Mater. Sci. 8, 1545 (1973). 10.1007/BF00754888
12. M. A. Makeev, R. Cuerno, and A.-L. Barabasi, Nucl. Instrum. Methods Phys. Res. B 197, 185 (2002). 10.1016/S0168-583X(02)01436-2
13. S. Rusponi, G. Costantini, C. Boragno, and U. Valbusa, Phys. Rev. Lett. 81, 4184 (1998). 10.1103/PhysRevLett.81.4184
14. S. Rusponi, G. Costantini, C. Boragno, and U. Valbusa, Phys. Rev. Lett. 81, 2735 (1998). 10.1103/PhysRevLett.81.2735
15. H. Hansen, A. Redinger, S. Messlinger, G. Stoian, Y. Rosandi, H. M. Urbassek, U. Linke, and T. Michely, Phys. Rev. B 73, 235414 (2006). 10.1103/PhysRevB.73.235414
16. Z. Postawa, R. Maboudian, M. El-Maazawi, M. H. Erwin, M. C. Wood, and N. Winograd, J. Chem. Phys. 96, 3298 (1992). 10.1063/1.461975
17. Z. Postawa, Radiat. Eff. Defects Solids 128, 107 (1994). 10.1080/10420159408218861
18. M. Szymonski, Nucl. Instrum. Methods Phys. Res. B 46, 427 (1990). 10.1016/0168-583X(90)90742-D
19. R. M. Wilson and R. T. Williams, Nucl. Instrum. Methods Phys. Res. B 101, 122 (1995). 10.1016/0168-583X(95)00069-0
20. C. Barth and C. R. Henry, Nanotechnology 15, 1264 (2004). 10.1088/0957-4484/15/9/026
21. B. J. Garrison and Z. Postawa, Mass Spectrom. Rev. 27, 289 (2008). 10.1002/mas.20165
22. M. Tosi and F. Fumi, J. Phys. Chem. Solids 25, 45 (1964). 10.1016/0022-3697(64)90160-X
23. W. D. Wilson and L. G. Haggmark, Phys. Rev. B 15, 2458 (1977). 10.1103/PhysRevB.15.2458
24. R. Bennewitz, S. Schar, V. Barwich, O. Pfeiffer, E. Meyer, F. Krok, B. Such, J. Kolodziej, and M. Szymonski, Surf. Sci. 474, L197 (2001). 10.1016/S0039-6028(00)01053-0
25. S. W. Rosencrance, D. E. Riederer, R. Chatterjee, C. He, N. Winograd, and Z. Postawa, Nucl. Instrum. Methods Phys. Res. B 101, 137 (1995). 10.1016/0168-583X(95)00299-5
26. F. Krok, J. J. Kolodziej, B. Such, P. Czuba, P. Piatkowski, P. Struski, and M. Szymonski, Nucl. Instrum. Methods Phys. Res. B 226, 601 (2004).
27. S. R. Saeed, O. P. Sinha, F. Krok, and M. Szymonski, Appl. Surf. Sci. 255, 1766 (2008). 10.1016/j.apsusc.2008.06.043
28. B. Such, J. Kolodziej, P. Czuba, P. Piatkowski, P. Struski, F. Krok, and M. Szymoński, Phys. Rev. Lett. 85, 2621 (2000). 10.1103/PhysRevLett.85. 2621
29. M. Szymonski, K. Dan. Vidensk. Selsk. Mat. Fys. Medd. 43, 495 (1993).
30. M. Szymonski, J. Kolodziej, B. Such, P. Piatkowski, P. Struski, P. Czuba, and F. Krok, Prog. Surf. Sci. 67, 123 (2001). 10.1016/S0079-6816(01)00019-3
31. V. Puchin, A. Shluger, Y. Nakai, and N. Itoh, Phys. Rev. B 49, 11364 (1994). 10.1103/PhysRevB.49.11364
32. We assume that due to the atomically sharp tip apex (atomically resolved nc-AFM images, at least in the Z direction) the RMS values exhibit the inherent properties of the developed morphologies not influenced by the convolution with the tip shape.
33. A.-L. Barabasi and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, 1995).
34. I. Koponen, M. Hautala, and O.-P. Sievanen, Phys. Rev. B 54, 13502 (1996). 10.1103/PhysRevB.54.13502
35. R. Cuerno, H. A. Makse, S. Tomassone, S. T. Harrington, and H. E. Stanley, Phys. Rev. Lett. 75, 4464 (1995). 10.1103/PhysRevLett.75.4464