Microstructural tomography of a Ni70 Cr20 Al10 superalloy using focused ion beam microscopy

Ultramicroscopy

Volumn 109, Issue 10, 2009, Pages 1229-1235

  Uchic, M D ^a   De Graef, M ^b   Wheeler, R ^c   Dimiduk, D M ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c UES INC   (United States)

Author keywords

3D reconstruction; Focused ion beam milling; Nickel base superalloy; Serial sectioning

Indexed keywords

2D IMAGES; 3D RECONSTRUCTION; AUTOMATED PROCESSING; DEPTH PROFILE; FOCUSED ION BEAM MICROSCOPY; FOCUSED ION BEAM MILLING; IMAGE-PROCESSING SOFTWARE; ION MILLING; MATERIAL REMOVAL; MICRO-STRUCTURAL; MILLING RATE; NICKEL-BASE SUPERALLOY; NORMAL INCIDENCE; SECONDARY-ELECTRON IMAGE; SERIAL SECTIONING; THREE DIMENSIONS;

BEAM PLASMA INTERACTIONS; CHROMIUM; DEPTH PROFILING; ELECTRON OPTICS; FOCUSED ION BEAMS; IMAGE RECONSTRUCTION; ION BOMBARDMENT; IONS; MICROSTRUCTURE; MILLING (MACHINING); NICKEL; NICKEL ALLOYS; SUPERALLOYS; TOMOGRAPHY; TWO DIMENSIONAL;

THREE DIMENSIONAL;

ALLOY; ALUMINUM; CHROMIUM; METAL DERIVATIVE; NICKEL;

ARTICLE; IMAGE ANALYSIS; IMAGE PROCESSING; ION BEAM MICROSCOPY; MICROSCOPE; MICROSCOPY; PRECIPITATION; THREE DIMENSIONAL IMAGING; TOMOGRAPHY;

EID: 68749106836     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.05.008     Document Type: Article

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