Stress/strain induced flux pinning in highly dense MgB2 bulks

IEEE Transactions on Applied Superconductivity

Volumn 19, Issue 3, 2009, Pages 2722-2725

  Zeng, R ^a   Dou, Shi Xue ^a   Lu, L ^a   Li, W X ^a   Poh, C K ^a   Kim, J H ^a   Horvat, J ^a   Shi, D Q ^a   Wang, J L ^b,c   Munroe, P ^d   Wang, X F ^e   Zheng, R K ^e   Ringer, S P ^e   Rindfleisch, M ^f   Tomsic, M ^f  

^a UNIVERSITY OF WOLLONGONG   (Australia)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

^c AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^d UNIVERSITY OF NEW SOUTH WALES   (Australia)

^e UNIVERSITY OF SYDNEY   (Australia)

^f Hyper Tech Research Inc   (United States)

Author keywords

Critical current density; Flux pinning; MgB2; Strain field

Indexed keywords

C-DOPED; FLUX PINNING BEHAVIOR; HIGH DENSITY; HIGH PURITY; HIGHLY DENSE; MGB2; MICRO-DEFECTS; PRESSED PELLETS; REACTION TEMPERATURE; SIC NANOPARTICLES; STRAIN FIELD; STRESS/STRAIN; STRESS/STRAIN FIELDS;

PELLETIZING; POINT DEFECTS; SILICON CARBIDE;

FLUX PINNING;

EID: 68749088275     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2009.2019577     Document Type: Conference Paper

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