Microstructures of SiC nanoparticle-doped Mg B2 Fe tapes

Journal of Applied Physics

Volumn 102, Issue 1, 2007, Pages

  Zhu, Y ^a   Matsumoto, A ^b   Senkowicz, B J ^c   Kumakura, H ^b   Kitaguchi, H ^b   Jewell, M C ^c   Hellstrom, E E ^b   Larbalestier, D C ^a   Voyles, P M ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOSCALE GRAINS; OXIDE SECOND PHASES; REACTION TEMPERATURES;

ELECTRON ENERGY LOSS SPECTROSCOPY; MAGNESIUM COMPOUNDS; MICROSTRUCTURE; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

NANOPARTICLES;

EID: 34547202025     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2750409     Document Type: Article

References (22)

1. B. J. Senkowicz, J. E. Giencke, S. Patnaik, C. B. Eom, E. E. Hellstrom, and D. C. Larbalestier, Appl. Phys. Lett. 86, 202502 (2005).
2. R. H. T. Wilke, S. L. Bud'ko, P. C. Canfield, D. K. Finnemore, R. J. Suplinskas, and S. T. Hannahs, Phys. Rev. Lett. 92, 217003 (2004).
3. A. Serquis, G. Serrano, S. M. Moreno, L. Civale, B. Maiorov, F. Balakirev, and M. Jaime, Supercond. Sci. Technol. 20, L12 (2007).
4. S. M. Kazakov, Phys. Rev. B 71, 024533 (2005).
5. A. Gurevich, Supercond. Sci. Technol. 17, 278 (2004).
6. S. X. Dou, Appl. Phys. Lett. 81, 3419 (2002).
7. A. Matsumoto, Appl. Phys. Lett. 89, 132508 (2006).
8. S. X. Dou, V. Braccini, S. Soltanian, R. Klie, Y. Zhu, S. Li, X. L. Wang, and D. C. Larbalestier, J. Appl. Phys. 96, 7549 (2004).
9. S. Li, Appl. Phys. Lett. 83, 314 (2003).
10. M. D. Sumption, M. Bhatia, M. Rindfleisch, M. Tomsic, S. Soltanian, S. X. Dou, and E. W. Collings, Appl. Phys. Lett. 86, 092507 (2005).
11. S. Hata, T. Yoshidome, H. Sosiati, Y. Tomokiyo, N. Kuwano, A. Matsumoto, H. Kitaguchi, and H. Kumakura, Supercond. Sci. Technol. 19, 161 (2006).
12. A. Matsumoto, H. Kumakura, H. Kitaguchi, and H. Hatakeyama, Supercond. Sci. Technol. 16, 926 (2003).
13. P. C. Canfield, S. L. Bud'ko, and D. K. Finnemore, Physica C 385, 1 (2003).
14. J. Jiang, B. J. Senkowicz, D. C. Larbalestier, and E. E. Hellstrom, Supercond. Sci. Technol. 19, L33 (2006).
15. J. M. Rowell, Supercond. Sci. Technol. 16, R17 (2003).
16. P. M. Voyles, J. L. Grazul, and D. A. Muller, Ultramicroscopy 96, 251 (2003).
17. S. Hillyard and J. Silcox, Ultramicroscopy 52, 325 (1993).
18. R. F. Klie, J. C. Idrobo, N. D. Browning, A. Serquis, Y. T. Zhu, X. Z. Liao, and F. M. Mueller, Appl. Phys. Lett. 80, 3970 (2002).
19. R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1986).
20. S. Lee, T. Masui, A. Yamamoto, H. Uchiyama, and S. Tajima, Physica C 412-414, 31 (2004).
21. R. Schneider, J. Woltersdorf, and O. Lichtenberger, J. Phys. D 29, 1709 (1996).
22. H. Kitaguchi, A. Matsumoto, H. Kumakura, T. Doi, H. Yamamoto, K. Saitoh, H. Sosiati, and S. Hata, Appl. Phys. Lett. 85, 2842 (2004).