Influence of thick crystal effects on ptychographic image reconstruction with moveable illumination

Ultramicroscopy

Volumn 109, Issue 10, 2009, Pages 1263-1275

  Liu, Cheng ^a   Walther, T ^a   Rodenburg, J M ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Dynamical scattering; Electron microscopy; Phase retrieval; Ptychography

Indexed keywords

CRYSTAL EFFECTS; DYNAMICAL SCATTERING; PHASE RETRIEVAL; PHYSICAL REVIEW; PTYCHOGRAPHY; SILICON CRYSTAL; SLICE METHOD; TRANSMISSION FUNCTION; TWO-DIMENSIONAL GRATING;

DIFFRACTION GRATINGS; DIFFRACTION PATTERNS; HOLOGRAPHIC INTERFEROMETRY; IMAGING TECHNIQUES; LIGHT TRANSMISSION; PROBES;

IMAGE RECONSTRUCTION;

SILICON;

ALGORITHM; ANALYTIC METHOD; ARTICLE; CONTROLLED STUDY; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ILLUMINATION; IMAGE RECONSTRUCTION; PTYCHOGRAPHY; THICKNESS;

EID: 68549125072     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.05.017     Document Type: Article

References (17)

1. Faulkner H.M.L., and Rodenburg J.M. Physical Review Letters 93 (2004) 023903
2. Rodenburg J.M., and Faulkner H.M.L. Applied Physics Letters 85 (2004) 4795
3. Faulkner H.M.L., and Rodenburg J.M. Ultramicroscopy 103 (2005) 153 (21 (1982) 2758)
4. Fienup J.R. Appl. Opt.ied Optics 21 (1982) 875
5. Rodenburg J.M. Advances in Imaging and Electron Physics 150 (2008) 87
6. Rodenburg J.M., Hurst A., and Cullis A. Ultramicroscopy 107 (2007) 227
7. Rodenburg J.M., Hurst A.C., Cullis A.G., Dobson B.R., Pfeiffer F., Bunk O., David C., Jefimovs K., and Johnson I. Physic Review Letters 98 (2007) 034801
8. Thibault P., Dierolf M., Menzel A., Bunk O., David C., and Pfeiffer F. Science 321 (2008) 379
9. Kirkland E.J. Advanced Computing in Electron Microscopy (1998), Springer, Berlin p. 106
10. Nellist P.D., McCallum B.C., and Rodenburg J.M. Nature 374 (1995) 630
11. J.M. Rodenburg, R.H.T. Bates, Phil. Trans. R. Soc. Lond. A 339 (1992) 521
12. Chapman H.N. Ultramicroscopy 66 (1996) 153
13. Chapman H.N. Scanning Microscopy 11 (1997) 67
14. Spence J.C.H. Acta Cryst. A 65 (2009) 28
15. Spence J.C.H., and Zuo J.M. Electron Microdiffraction (1992), Plenum, New York p. 177
16. Oliver B., Martin D., Søren K., Ian J., Othmar M., and Franz P. Ultramicroscopy 108 (2008) 481-487
17. Mitome M. Journal of Electron Microscopy 48 (1999) 27