Contrast transfer function under convergent beam illumination measured by field emission gun

Journal of Electron Microscopy

Volumn 48, Issue 1, 1999, Pages 27-32

  Mitome, Masanori ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Contrast transfer function; Convergent beam illumination; Field emission gun; High resolution; Local structure

Indexed keywords

FIELD EMISSION; TRANSFER FUNCTIONS;

BEAM ILLUMINATION; CONTRAST TRANSFER FUNCTION; CONVERGENT BEAM ILLUMINATION; CONVERGENT BEAMS; FIELD EMISSION GUNS; HIGH CURRENT DENSITIES; HIGH RESOLUTION; INTERFERENCE FRINGE; LOCAL STRUCTURE; SURFACE INTERFACES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033021304     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023646     Document Type: Article

References (12)

1. Mitome M, Takayanagi K, and Tanishiro Y (1990) Improvement of resolution by convergent-beam illumination in surface profile images of high resolution transmission electron microscopy. Ultramicroscopy 33: 255.
2. Mitome M and Takayanagi K (1996) Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy. Ultramicroscopy 62: 123.
3. Cowley J M (1975) Diffraction Physics. (North-Holland, Amsterdam).
4. Hanszen K J and Trepre L (1971) The contrast transfer of the electron microscope with partial coherent illumination. Part B: Disk-shaped source. Optik 33: 182.
5. Reimer L D (1984) Transmission Electron Microscopy. (Springer, New York).
6. Bando Y, Kitami Y, Kurashima K, Tomita T, Honda T, and Ishida Y (1994) Development and application of 300 kV field emission analytical transmission electron microscope. Microbeam Anal. 3: 279.
7. Hoppe W, Köstler D, Typke D, and Hunsmann N (1975) Contrast transfer for bright field image reconstruction with tilted illumination in electron microscopy. Optik 42: 43.
8. Wade R H and Jenkins W K (1978) Tilted beam electron microscopy: the effective coherent aperture. Optik 50: 1.
9. Hanszen K J and Trepre L (1971) The contrast transfer of the electron microscope with partial coherent illumination. Part A: Ring condenser. Optik 33: 166.
10. Fertig J and Rose H (1979) On the theory of image formation in the electron microscope II. Optik 54: 165.
11. Downing K H (1975) Note on transfer function in electron microscopy with tilted illumination. Optik 33: 199.
12. Saxton W O, Jenkins W K, Freeman L A, and Smith D J (1978) TEM observations using bright field hollow cone illumination. Optik 49: 505.