Avalanche, Joule breakdown and hysteresis in carbon nanotube transistors

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2009, Pages 405-408

  Pop, Eric ^a   Dutta, Sumit ^a   Estrada, David ^a   Liao, Albert ^a  

^a United States of America   (United States)

Author keywords

Avalanche; Breakdown; Carbon nanotube; Hysteresis

Indexed keywords

AVALANCHE; AVALANCHE BEHAVIOR; BREAKDOWN; CARBON NANOTUBE TRANSISTORS; HIGH CURRENTS; HIGH FIELD; HYSTERESIS EFFECT; PULSED MEASUREMENTS;

HYSTERESIS; OXYGEN; RELIABILITY;

CARBON NANOTUBES;

EID: 68349153422     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2009.5173287     Document Type: Conference Paper

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