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Volumn 32, Issue 2, 2009, Pages 415-423

High-frequency propagation on printed circuit board using a material with a low dielectric constant, a low dielectric loss, and a flat surface

Author keywords

Dielectric losses; Dielectric materials; Microstrip; Microwave propagation; Printed circuits; RLC circuits; Scattering parameter measurement; Time domain reflectometry; Transmission line measurements

Indexed keywords

MICROSTRIP; MICROWAVE PROPAGATION; RLC CIRCUITS; SCATTERING PARAMETER MEASUREMENT; TIME-DOMAIN REFLECTOMETRY; TRANSMISSION LINE MEASUREMENTS;

EID: 68349143111     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2008.2004791     Document Type: Article
Times cited : (7)

References (11)
  • 1
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    • Morgan, S.P.1
  • 6
    • 68349134385 scopus 로고    scopus 로고
    • A 960-fps sub-sampling object extraction CMOS image sensor with 12-bit column parallel ADCs and ALUs
    • San Jose, CA
    • Y. Motohashi, T. Kubo, H. Kanto, T. Tate, and S. Sugawa, "A 960-fps sub-sampling object extraction CMOS image sensor with 12-bit column parallel ADCs and ALUs," in Electron. Imag. Sci. Technol., San Jose, CA, 2007, pp. 151-158.
    • (2007) Electron. Imag. Sci. Technol , pp. 151-158
    • Motohashi, Y.1    Kubo, T.2    Kanto, H.3    Tate, T.4    Sugawa, S.5
  • 7
    • 68349147309 scopus 로고    scopus 로고
    • Agilent Signal Integrity Analysis Series, Part1: Single-Port TDR, TDR/TDT, and 2-Port TDR, Agilent Technologies, Inc., 2007.
    • "Agilent Signal Integrity Analysis Series, Part1: Single-Port TDR, TDR/TDT, and 2-Port TDR," Agilent Technologies, Inc., 2007.
  • 8
    • 19244380723 scopus 로고    scopus 로고
    • Unified method for determining the complex propagation constant of reflecting and nonreflecting transmission lines
    • Aug
    • J. A. Reynoso-Hernández, "Unified method for determining the complex propagation constant of reflecting and nonreflecting transmission lines," IEEE Microw. Guided Wave Lett., vol. 13, no. 8, pp. 351-353, Aug. 2003.
    • (2003) IEEE Microw. Guided Wave Lett , vol.13 , Issue.8 , pp. 351-353
    • Reynoso-Hernández, J.A.1
  • 9
    • 0032002546 scopus 로고    scopus 로고
    • A simple error correction method for two-port transmission parameter measurement
    • C. Wan, B. Nauwelaers, and W. De Raedt, "A simple error correction method for two-port transmission parameter measurement," IEEE Microw. Guided Wave Lett., vol. 8, pp. 58-59, 1998.
    • (1998) IEEE Microw. Guided Wave Lett , vol.8 , pp. 58-59
    • Wan, C.1    Nauwelaers, B.2    De Raedt, W.3
  • 10
    • 0020704286 scopus 로고
    • Simple formulas for two- and three-dimensional capacitances
    • Feb
    • T. Sakurai and K. Tamaru, "Simple formulas for two- and three-dimensional capacitances," IEEE Trans. Electron Devices, vol. ED-30, no. 2, pp. 183-185, Feb. 1983.
    • (1983) IEEE Trans. Electron Devices , vol.ED-30 , Issue.2 , pp. 183-185
    • Sakurai, T.1    Tamaru, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.