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Volumn 8, Issue 2, 1998, Pages 58-59

Simple error correction method for two-port transmission parameter measurement

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ERROR ANALYSIS; ERROR CORRECTION; TRANSMISSION LINE THEORY;

EID: 0032002546     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.658640     Document Type: Article
Times cited : (30)

References (7)
  • 1
    • 0018720739 scopus 로고
    • G. F. Engen C. A. Hoer `Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer IEEE Trans. Microwave Theory Tech. MTT-27 987 993 Dec. 1979
    • (1979) , vol.MTT-27 , pp. 987-993
    • Engen, G.F.1    Hoer, C.A.2
  • 3
    • 0030128492 scopus 로고    scopus 로고
    • M.-Q. Lee S. Nam An accurate broadband measurement of substrate dielectric constant IEEE Microwave Guided Wave Lett. 6 168 170 Apr. 1996 75 10345 481077
    • (1996) , vol.6 , pp. 168-170
    • Lee, M.-Q.1    Nam, S.2
  • 4
    • 0030212655 scopus 로고    scopus 로고
    • C. Wan B. Nauwelaers W. De Raedt M. Van Rossum Complex permittivity measurement method based on asymmetry of reciprocal two-ports Electron. Lett. 32 16 1497 1498 Aug. 1996 2220 11255 511920
    • (1996) , vol.32 , Issue.16 , pp. 1497-1498
    • Wan, C.1    Nauwelaers, B.2    De Raedt, W.3    Van Rossum, M.4
  • 6
    • 0026188064 scopus 로고
    • R. B. Marks A multiline method of network analyzer calibration IEEE Trans. Microwave Theory Tech. 39 1205 1215 July 1991 22 2792 85388
    • (1991) , vol.39 , pp. 1205-1215
    • Marks, R.B.1
  • 7
    • 85176680960 scopus 로고
    • K.-H. Back H.-Y. Sung W. S. Park A 3-position transmission/reflection method for measuring the permittivity of low loss materials IEEE Microwave Guided Wave Lett. 5 3 5 Jan. 1995 75 8668 382378
    • (1995) , vol.5 , pp. 3-5
    • Back, K.-H.1    Sung, H.-Y.2    Park, W.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.