Theoretical investigation of van der Waals forces between solid surfaces at nanoscales

Surface Science

Volumn 603, Issue 16, 2009, Pages 2580-2587

  Kudryavtsev, Yaroslav V ^a   Gelinck, Edwin ^b   Fischer, Hartmut R ^b  

^a TOPCHIEV INSTITUTE OF PETROCHEMICAL SYNTHESIS   (Russian Federation)

^b TNO   (Netherlands)

Author keywords

Semi empirical models and model calculations; Silicon; Silicon oxides; Sticking; Surface structure, morphology, roughness, and topography; van der Waals force

Indexed keywords

ADSORBED WATER; HEIGHT DISTRIBUTION; LIQUID LAYER; NANO SCALE; NANO-SCALE ROUGHNESS; ORDER OF MAGNITUDE; OXIDE LAYER; SEMI-EMPIRICAL MODELS AND MODEL CALCULATIONS; SOLID SILICON; SOLID SURFACE; STICKING; SURFACE DENSITY; SURFACE STRUCTURE, MORPHOLOGY, ROUGHNESS, AND TOPOGRAPHY; THEORETICAL INVESTIGATIONS;

DIELECTRIC PROPERTIES; LIQUIDS; NANOSTRUCTURED MATERIALS; PRESSURE EFFECTS; SILICON OXIDES; SURFACE MORPHOLOGY; SURFACE TOPOGRAPHY; TOPOGRAPHY;

VAN DER WAALS FORCES;

EID: 68249158302     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.06.007     Document Type: Article

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