An atomic force microscopy study of the adhesion of a silica sphere to a silica surface - Effects of surface cleaning

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 157, Issue 1-3, 1999, Pages 117-125

  Bowen, W Richard ^a   Hilal, Nidal ^a   Lovitt, Robert W ^a   Wright, Chris J ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Adhesion; Atomic force microscope; DLVO; Double layer electrostatic; London van der Waals; Silica

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; COLLOIDS; ELECTROSTATICS; PH; PLASMA APPLICATIONS; SURFACE CLEANING; SURFACES;

ELECTROSTATIC DOUBLE LAYER INTERACTIONS; PLANAR SILICA SURFACE; PLASMA TREATMENT; SILICA SPHERE;

SILICA;

SILICON DIOXIDE;

ADHESION; ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; ION EXCHANGE; LUBRICATION; MOLECULAR INTERACTION; PARTICULATE MATTER; PRIORITY JOURNAL; SPECTROSCOPY; SURFACE PROPERTY;

EID: 0032836409     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(99)00045-X     Document Type: Article

References (26)

1. J.N. Israelachvili, Intermolecular and surface forces, 2nd ed., Academic Press, London, 1991.
2. Rynders R.M., Hegedus C.R., Gilicinski A.G. Characterisation of particle coalescence in waterborne coatings using atomic force microscopy. J. Coatings Technol. 67:1995;59-69.
3. D.A. Brandreth, R.E. Johnson, Particulate removal in microelectronics manufacture, in: K.L. Mittal (Ed.), Surface contamination: genesis, detection and control, vol. 1, Plenum, New York, 1977, pp. 83-88.
4. Mangipudi V., Tirrell M., Pocius A.V. Direct measurement of molecular level adhesion between poly(ethylene terephthalate) and polyethylene films: determination of surface and interfacial energies. J. Adhesion Sci. Technol. 8:1994;1251-1270.
5. Vigil G., Xu Z., Steinberg S., Israelachvili S., Israelachvili J. Interactions of silica surfaces. J. Colloid Interf. Sci. 165:1994;367-385.
6. Binnig G., Quate C., Greber G. Atomic force microscope. Phys. Rev. Lett. 56:1986;930-933.
7. Ducker W.A., Senden T.J., Pashley R.M. Measurement of forces in liquids using a force microscope. Langmuir. 8:1992;1831-1836.
8. Bowen W.R., Hilal N., Lovitt R.W., Sharif A.O., Williams P.M. Atomic force microscope studies of membranes: force measurement and imaging in electrolyte solutions. J. Membr. Sci. 126:1997;77-89.
9. Atkins D.T., Pashley R.M. Surface forces between ZnS and mica in aqueous electrolytes. Langmuir. 9:1993;2232-2236.
10. Butt H.-J., Jaschke M., Ducker W. Measuring surface forces in aqueous electrolyte solution with the atomic force microscope. Bioelectrochem. Bioenerg. 38:1995;191-201.
11. Veeramasunei S., Yalamanchili M.R., Miller J.D. Measurement of interaction forces between silica and α-alumina by atomic force microscopy. J. Colloid Interf. Sci. 184:1996;594-600.
12. Toikka G., Hayes R.A., Ralston J. Adhesion of iron oxide to silica studied by atomic force microscopy. J. Colloid Interf. Sci. 180:1996;329-338.
13. Pierce M., Stuart J., Pungor A., Dryden P., Hlady V. Adhesion force measurements using an atomic force microscope upgraded with a linear position sensitive detector. Langmuir. 10:1994;3217-3221.
14. Feldman K., Tervoort T., Smith P., Spencer N. Towards a force spectroscopy of polymer surfaces. Langmuir. 14:1998;372-378.
15. Hoh J.H., Revel J.-P., Hansma P.K. Tip-sample interactions in atomic force microscopy: 1. Modulating adhesion between silicon nitride, glass. Nanotechnology. 2:1991;119-122.
16. Biggs S., Healy T.W. Electrostatic stabilisation of colloidal zirconia with low-molecular weight polyacrylic acid. J. Chem. Soc. Faraday Trans. 90:1994;3415-3421.
17. Braithwaite G.J.C., Howe A., Luckham P.F. Interactions between poly(ethylene oxide) layers adsorbed to glass surfaces probed by using a modified atomic force microscope. Langmuir. 12:1996;4224-4237.
18. Larson I., Chan D.Y.C., Drummond C.J., Grieser F. Use of atomic force microscopy force measurements to monitor citrate displacement by amines on gold in aqueous solution. Langmuir. 13:1997;2429-2431.
19. Drummond C.J., Senden T.J. Examination of the geometry of long-range tip-sample interaction in atomic force microscopy. Colloids Surf. A. 87:1994;217-234.
20. Rutland M.W., Senden T.J. Adsorption of poly(oxyethylene) nonionic surfactant C12E5 to silica: a study using atomic force microscopy. Langmuir. 9:1993;412-418.
21. Cleveland J.P., Manne S., Bocek D., Hansma P.K. A non-destructive method for determining the spring constant of cantilevers for scanning force microscopy. Rev. Sci. Instruments. 64:1993;402-405.
22. S. Timoshenko, Strength of Materials, Krieger Publishing Company, Florida, 1985, pp. 137-175.
23. Bowen W.R., Jenner F. Dynamic ultrafiltration model for charged colloidal dispersions: a Wigner-Seitz cell approach. Chem. Eng. Sci. 50:1995;1707-1736.
24. Bergström L. Hamaker constants of inorganic materials. Adv. Colloid Interf. Sci. 70:1997;125-169.
25. Roth C.M., Lenhoff A.M. Improved parametric representation of water dielectric data for the Lifshitz theory calculations. J. Colloid Interf. Sci. 179:1996;637-639.
26. Grabbe A., Horn R.G. Double layer and hydration forces measured between silica sheets subjected to various treatments. J. Colloid Interf. Sci. 157:1993;375-383.