SCOPUS 정보 검색 플랫폼

Volumn 106, Issue 2, 2009, Pages

Resistance and superconductivity switching caused by carrier injection: Evidences of self-trapping carriers in oxide electronics

(4) Chen, Yuansha a Chen, Liping a Lian, Guijun a Xiong, Guangcheng a

a PEKING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER INJECTION; CARRIER MOVEMENT; DISTINCT EVIDENCE; DOPED MANGANITES; FUNCTIONAL OXIDES; HETERO INTERFACES; INJECTED CARRIERS; INTERFACE BARRIER; INTRINSIC PROPERTY; MANGANITE JUNCTION; OXIDE ELECTRONICS; OXIDE JUNCTION; RESISTANCE SWITCHING; RESISTANCE SWITCHING EFFECT; SELF-TRAPPING;

ELECTRIC FIELDS; EPITAXIAL FILMS; OXIDE MINERALS; SUPERCONDUCTIVITY;

OXIDE FILMS;

EID: 68249136921 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3176491 Document Type: Article

Times cited : (23)

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