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Volumn 34, Issue 12, 2009, Pages 2571-2576

A new energy efficient, environment friendly and high productive texturization process of industrial multicrystalline silicon solar cells

Author keywords

Cost effectiveness; Industrial multicrystalline silicon solar cells; Isotropic texture using NaOH NaOCl; Quality improvement analysis

Indexed keywords

AFM; ELEVATED TEMPERATURE; ENERGY EFFICIENT; ENVIRONMENT FRIENDLY; HIGHER TEMPERATURES; HYDROCHLORIC ACID SOLUTION; INDUSTRIAL MULTICRYSTALLINE SILICON SOLAR CELLS; INDUSTRIAL PROCESSS; INDUSTRIAL PRODUCTION LINES; ISOTROPIC TEXTURE USING NAOH-NAOCL; MULTI-CRYSTALLINE SILICON SOLAR CELLS; NAOH SOLUTIONS; OPTIMIZED CONDITIONS; QUALITY IMPROVEMENT ANALYSIS; SEM; SODIUM HYDROXIDES; SODIUM HYPOCHLORITES; SOLAR CELL EFFICIENCIES; SURFACE TEXTURE ANALYSIS; TEXTURIZATION;

EID: 68249126543     PISSN: 09601481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.renene.2009.04.017     Document Type: Article
Times cited : (18)

References (11)
  • 3
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    • Application of acid texturing to multicrystalline silicon wafers
    • Park S.W., and Kim J. Application of acid texturing to multicrystalline silicon wafers. Journal of Korean Physical Society 43 3 (2003) 423-426
    • (2003) Journal of Korean Physical Society , vol.43 , Issue.3 , pp. 423-426
    • Park, S.W.1    Kim, J.2
  • 7
    • 0036778466 scopus 로고    scopus 로고
    • Large area multicrystalline silicon solar cells in high volume production environment - history, status, new processes, technology transfer issues
    • Narayanan S. Large area multicrystalline silicon solar cells in high volume production environment - history, status, new processes, technology transfer issues. Solar Energy Materials and Solar Cells 74 (2002) 107-115
    • (2002) Solar Energy Materials and Solar Cells , vol.74 , pp. 107-115
    • Narayanan, S.1
  • 10
    • 0030212596 scopus 로고    scopus 로고
    • Measurement of shallow dopant impurity profile in silicon using anodic sectioning and Lange method of Hall measurement
    • Basu P.K., Chakravarty B.C., Singh S.N., Dutta P., and Kesavan R. Measurement of shallow dopant impurity profile in silicon using anodic sectioning and Lange method of Hall measurement. Solar Energy Materials and Solar Cells 43 (1996) 15-20
    • (1996) Solar Energy Materials and Solar Cells , vol.43 , pp. 15-20
    • Basu, P.K.1    Chakravarty, B.C.2    Singh, S.N.3    Dutta, P.4    Kesavan, R.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.