메뉴 건너뛰기




Volumn , Issue , 2007, Pages 847-850

A new energy efficient and environment friendly chemical process for texturization of industrial multicrystalline silicon solar cell

Author keywords

Cost effectiveness; Environment friendly process; Industrial large area multicrystalline silicon solar cells; Isotropic texture using NaOCl and NaOH; Quality improvements

Indexed keywords

CHEMICAL ENGINEERING; CHEMICAL REACTIONS; CONSERVATION; COST EFFECTIVENESS; DIRECT ENERGY CONVERSION; ELECTRIC CONDUCTIVITY; ENERGY EFFICIENCY; HYDROCHLORIC ACID; NONMETALS; PHOTOVOLTAIC CELLS; POLYSILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR SWITCHES; SILICON; SILICON SOLAR CELLS; SODIUM; SOLAR CELLS; SOLAR ENERGY; SOLAR EQUIPMENT;

EID: 49749112953     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IWPSD.2007.4472653     Document Type: Conference Paper
Times cited : (4)

References (9)
  • 3
    • 0141593408 scopus 로고    scopus 로고
    • Application of acid texturing to multicrystalline silicon wafers
    • S. W. Park and J. Kim, "Application of acid texturing to multicrystalline silicon wafers" Journal of Korean Physical Society 43-3 (2003), p.432-426.
    • (2003) Journal of Korean Physical Society , vol.43 -3 , pp. 432-426
    • Park, S.W.1    Kim, J.2
  • 6
    • 0036778466 scopus 로고    scopus 로고
    • Large area multicrystalline silicon solar cells in high volume production environment - history, status, new processes, technology transfer issues
    • S. Narayanan, "Large area multicrystalline silicon solar cells in high volume production environment - history, status, new processes, technology transfer issues", Solar Energy Materials & Solar Cells, 74 (2002), p.107-115
    • (2002) Solar Energy Materials & Solar Cells , vol.74 , pp. 107-115
    • Narayanan, S.1
  • 9
    • 0030212596 scopus 로고    scopus 로고
    • Measurement of shallow dopant impurity profile in silicon using anodic sectioning and Lange method of Hall measurement
    • P.K.Basu, B.C.Chakravarty S.N.Singh, P.Dutta and R.Kesavan, "Measurement of shallow dopant impurity profile in silicon using anodic sectioning and Lange method of Hall measurement", Solar Energy Materials and Solar Cells, vol.43, (1996), p. 15-20.
    • (1996) Solar Energy Materials and Solar Cells , vol.43 , pp. 15-20
    • Basu, P.K.1    Chakravarty, B.C.2    Singh, S.N.3    Dutta, P.4    Kesavan, R.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.