Optical constants of quaternary Ge-As-Te-In amorphous thin films evaluated from their reflectance spectra

Philosophical Magazine

Volumn 89, Issue 12, 2009, Pages 1063-1079

  Aly, K A ^a  

^a Al Azhar University   (Egypt)

Author keywords

Absorption edge; Amorphous thin film; Band gap; Optical constant

Indexed keywords

ABSORPTION EDGE; AMORPHOUS THIN FILM; AMORPHOUS THIN FILMS; AVERAGE COORDINATION NUMBER; BAND GAP; CHEMICAL COMPOSITIONS; COHESIVE ENERGIES; COMPLEX INDEX OF REFRACTION; EXTINCTION COEFFICIENTS; FUNDAMENTAL ABSORPTION EDGE; GLASS SUBSTRATES; IMAGINARY PARTS; INTERFERENCE FRINGE; OPTICAL ABSORPTION MEASUREMENT; REFLECTANCE SPECTRUM; REFLECTION SPECTRA; SPECTRAL REGION; THICKNESS VARIATION;

ABSORPTION; AMORPHOUS FILMS; CHEMICAL ANALYSIS; COORDINATION REACTIONS; ENERGY GAP; GERMANIUM; LIGHT REFRACTION; LIGHT TRANSMISSION; OPTICAL CONSTANTS; REFRACTIVE INDEX; REFRACTOMETERS; TELLURIUM COMPOUNDS; THERMAL EVAPORATION; THIN FILM DEVICES; THIN FILMS;

OPTICAL FILMS;

EID: 68149178468     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430902870542     Document Type: Article

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