Method of the Ratio of Envelopes of the Reflection Spectrum for Measuring Optical Constants and Thickness of Thin Films

Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

Volumn 88, Issue 4, 2000, Pages 581-585

  Filippov, V V ^a  

^a B I STEPANOV INSTITUTE OF PHYSICS   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT INTERFERENCE; SPECTROPHOTOMETERS; SPECTROPHOTOMETRY; THIN FILMS; TRANSPARENCY;

OPTICAL CONSTANTS;

LIGHT REFLECTION;

EID: 0012063668     PISSN: 0030400X     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.626854     Document Type: Article

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